2010 | OriginalPaper | Buchkapitel
Characterization Methods for Surface Integrity
verfasst von : Jianmei Zhang, Z. J. Pei
Erschienen in: Surface Integrity in Machining
Verlag: Springer London
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Since machined surface quality is a very important feature for numerous machine elements, many techniques have been developed to characterize and evaluate the surface integrity. This chapter reports a few general technologies used to characterize different aspects of the surface. In Section 4.1, some surface roughness measurement techniques will be introduced; in Section 4.2, X-ray diffraction and electron diffraction will be presented for crystalline structure; in Section 4.3, an X-ray energy-dispersive analyzer, Auger electron spectroscopy, and X-ray fluorescence are included for elemental analysis; Section 4.4 presents X-ray photoelectron spectroscopy and secondary ion mass spectrometry for chemical composition analysis; Section 4.5 reports the microcrystalline structure and dislocation density technology: transmission electron microscopy.