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Erschienen in: Automated Software Engineering 2/2018

16.08.2017

Cost-sensitive transfer kernel canonical correlation analysis for heterogeneous defect prediction

verfasst von: Zhiqiang Li, Xiao-Yuan Jing, Fei Wu, Xiaoke Zhu, Baowen Xu, Shi Ying

Erschienen in: Automated Software Engineering | Ausgabe 2/2018

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Abstract

Cross-project defect prediction (CPDP) refers to predicting defects in a target project using prediction models trained from historical data of other source projects. And CPDP in the scenario where source and target projects have different metric sets is called heterogeneous defect prediction (HDP). Recently, HDP has received much research interest. Existing HDP methods only consider the linear correlation relationship among the features (metrics) of the source and target projects, and such models are insufficient to evaluate nonlinear correlation relationship among the features. So these methods may suffer from the linearly inseparable problem in the linear feature space. Furthermore, existing HDP methods do not take the class imbalance problem into consideration. Unfortunately, the imbalanced nature of software defect datasets increases the learning difficulty for the predictors. In this paper, we propose a new cost-sensitive transfer kernel canonical correlation analysis (CTKCCA) approach for HDP. CTKCCA can not only make the data distributions of source and target projects much more similar in the nonlinear feature space, where the learned features have favorable separability, but also utilize the different misclassification costs for defective and defect-free classes to alleviate the class imbalance problem. We perform the Friedman test with Nemenyi’s post-hoc statistical test and the Cliff’s delta effect size test for the evaluation. Extensive experiments on 28 public projects from five data sources indicate that: (1) CTKCCA significantly performs better than the related CPDP methods; (2) CTKCCA performs better than the related state-of-the-art HDP methods.

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1
The left side of “\( \Rightarrow \)” denotes the source project and the right side of “\( \Rightarrow \)” denotes the target project
 
Literatur
Zurück zum Zitat Arisholm, E., Briand, L.C., Johannessen, E.B.: A systematic and comprehensive investigation of methods to build and evaluate fault prediction models. J. Syst. Softw. 83(1), 2–17 (2010)CrossRef Arisholm, E., Briand, L.C., Johannessen, E.B.: A systematic and comprehensive investigation of methods to build and evaluate fault prediction models. J. Syst. Softw. 83(1), 2–17 (2010)CrossRef
Zurück zum Zitat Bach, F.R., Jordan, M.I.: Kernel independent component analysis. J. Mach. Learn. Res. 3, 1–48 (2003)MathSciNetMATH Bach, F.R., Jordan, M.I.: Kernel independent component analysis. J. Mach. Learn. Res. 3, 1–48 (2003)MathSciNetMATH
Zurück zum Zitat Baktashmotlagh, M., Harandi, M., Lovell, B., Salzmann, M.: Unsupervised domain adaptation by domain invariant projection. In: ICCV’13, pp. 769–776 (2013) Baktashmotlagh, M., Harandi, M., Lovell, B., Salzmann, M.: Unsupervised domain adaptation by domain invariant projection. In: ICCV’13, pp. 769–776 (2013)
Zurück zum Zitat Belhumeur, P.N., Hespanha, J.P., Kriegman, D.J.: Eigenfaces vs. fisherfaces: recognition using class specific linear projection. IEEE Trans. Pattern Anal. Mach. Intell. 19(7), 711–720 (1997)CrossRef Belhumeur, P.N., Hespanha, J.P., Kriegman, D.J.: Eigenfaces vs. fisherfaces: recognition using class specific linear projection. IEEE Trans. Pattern Anal. Mach. Intell. 19(7), 711–720 (1997)CrossRef
Zurück zum Zitat Bezerra, M.E., Oliveiray, A.L., Adeodato, P.J.: Predicting software defects: A cost-sensitive approach. In: SMC’11, pp. 2515–2522 (2011) Bezerra, M.E., Oliveiray, A.L., Adeodato, P.J.: Predicting software defects: A cost-sensitive approach. In: SMC’11, pp. 2515–2522 (2011)
Zurück zum Zitat Bradley, A.P.: The use of the area under the roc curve in the evaluation of machine learning algorithms. Pattern Recogn. 30(7), 1145–1159 (1997)CrossRef Bradley, A.P.: The use of the area under the roc curve in the evaluation of machine learning algorithms. Pattern Recogn. 30(7), 1145–1159 (1997)CrossRef
Zurück zum Zitat Briand, L.C., Melo, W.L., Wust, J.: Assessing the applicability of fault-proneness models across object-oriented software projects. IEEE Trans. Softw. Eng. 28(7), 706–720 (2002)CrossRef Briand, L.C., Melo, W.L., Wust, J.: Assessing the applicability of fault-proneness models across object-oriented software projects. IEEE Trans. Softw. Eng. 28(7), 706–720 (2002)CrossRef
Zurück zum Zitat Camargo Cruz, A.E., Ochimizu, K.: Towards logistic regression models for predicting fault-prone code across software projects. In: ESEM’09, pp. 460–463 (2009) Camargo Cruz, A.E., Ochimizu, K.: Towards logistic regression models for predicting fault-prone code across software projects. In: ESEM’09, pp. 460–463 (2009)
Zurück zum Zitat Canfora, G., Lucia, A.D., Penta, M.D., Oliveto, R., Panichella, A., Panichella, S.: Defect prediction as a multiobjective optimization problem. Softw. Test. Verif. Reliab. 25(4), 426–459 (2015)CrossRef Canfora, G., Lucia, A.D., Penta, M.D., Oliveto, R., Panichella, A., Panichella, S.: Defect prediction as a multiobjective optimization problem. Softw. Test. Verif. Reliab. 25(4), 426–459 (2015)CrossRef
Zurück zum Zitat Catal, C., Diri, B.: Investigating the effect of dataset size, metrics sets, and feature selection techniques on software fault prediction problem. Inf. Sci. 179(8), 1040–1058 (2009)CrossRef Catal, C., Diri, B.: Investigating the effect of dataset size, metrics sets, and feature selection techniques on software fault prediction problem. Inf. Sci. 179(8), 1040–1058 (2009)CrossRef
Zurück zum Zitat Chen, L., Fang, B., Shang, Z., Tang, Y.: Negative samples reduction in cross-company software defects prediction. Inf. Softw. Technol. 62, 67–77 (2015)CrossRef Chen, L., Fang, B., Shang, Z., Tang, Y.: Negative samples reduction in cross-company software defects prediction. Inf. Softw. Technol. 62, 67–77 (2015)CrossRef
Zurück zum Zitat Cliff, N.: Ordinal Methods for Behavioral Data Analysis. Psychology Press, Routledge (2014) Cliff, N.: Ordinal Methods for Behavioral Data Analysis. Psychology Press, Routledge (2014)
Zurück zum Zitat D’Ambros, M., Lanza, M., Robbes, R.: Evaluating defect prediction approaches: a benchmark and an extensive comparison. Empir. Softw. Eng. 17(4–5), 531–577 (2012)CrossRef D’Ambros, M., Lanza, M., Robbes, R.: Evaluating defect prediction approaches: a benchmark and an extensive comparison. Empir. Softw. Eng. 17(4–5), 531–577 (2012)CrossRef
Zurück zum Zitat Demšar, J.: Statistical comparisons of classifiers over multiple data sets. J. Mach. Learn. Res. 7, 1–30 (2006)MathSciNetMATH Demšar, J.: Statistical comparisons of classifiers over multiple data sets. J. Mach. Learn. Res. 7, 1–30 (2006)MathSciNetMATH
Zurück zum Zitat Elish, K.O., Elish, M.O.: Predicting defect-prone software modules using support vector machines. J. Syst. Softw. 81(5), 649–660 (2008)CrossRef Elish, K.O., Elish, M.O.: Predicting defect-prone software modules using support vector machines. J. Syst. Softw. 81(5), 649–660 (2008)CrossRef
Zurück zum Zitat Fan, R.E., Chang, K.W., Hsieh, C.J., Wang, X.R., Lin, C.J.: Liblinear: a library for large linear classification. J. Mach. Learn. Res. 9, 1871–1874 (2008)MATH Fan, R.E., Chang, K.W., Hsieh, C.J., Wang, X.R., Lin, C.J.: Liblinear: a library for large linear classification. J. Mach. Learn. Res. 9, 1871–1874 (2008)MATH
Zurück zum Zitat Gao, K., Khoshgoftaar, T.M., Wang, H., Seliya, N.: Choosing software metrics for defect prediction: an investigation on feature selection techniques. Softw. Pract. Exp. 41(5), 579–606 (2011)CrossRef Gao, K., Khoshgoftaar, T.M., Wang, H., Seliya, N.: Choosing software metrics for defect prediction: an investigation on feature selection techniques. Softw. Pract. Exp. 41(5), 579–606 (2011)CrossRef
Zurück zum Zitat Ghotra, B., McIntosh, S., Hassan, A.E.: Revisiting the impact of classification techniques on the performance of defect prediction models. In: ICSE’15, pp. 789–800 (2015) Ghotra, B., McIntosh, S., Hassan, A.E.: Revisiting the impact of classification techniques on the performance of defect prediction models. In: ICSE’15, pp. 789–800 (2015)
Zurück zum Zitat Hall, T., Beecham, S., Bowes, D., Gray, D., Counsell, S.: A systematic literature review on fault prediction performance in software engineering. IEEE Trans. Softw. Eng. 38(6), 1276–1304 (2012)CrossRef Hall, T., Beecham, S., Bowes, D., Gray, D., Counsell, S.: A systematic literature review on fault prediction performance in software engineering. IEEE Trans. Softw. Eng. 38(6), 1276–1304 (2012)CrossRef
Zurück zum Zitat He, H., Garcia, E.A.: Learning from imbalanced data. IEEE Trans. Knowl. Data Eng. 21(9), 1263–1284 (2009)CrossRef He, H., Garcia, E.A.: Learning from imbalanced data. IEEE Trans. Knowl. Data Eng. 21(9), 1263–1284 (2009)CrossRef
Zurück zum Zitat He, Z., Shu, F., Yang, Y., Li, M., Wang, Q.: An investigation on the feasibility of cross-project defect prediction. Autom. Softw. Eng. 19(2), 167–199 (2012)CrossRef He, Z., Shu, F., Yang, Y., Li, M., Wang, Q.: An investigation on the feasibility of cross-project defect prediction. Autom. Softw. Eng. 19(2), 167–199 (2012)CrossRef
Zurück zum Zitat He, Z., Peters, F., Menzies, T., Yang, Y.: Learning from open-source projects: an empirical study on defect prediction. In: ESEM’13, pp. 45–54 (2013) He, Z., Peters, F., Menzies, T., Yang, Y.: Learning from open-source projects: an empirical study on defect prediction. In: ESEM’13, pp. 45–54 (2013)
Zurück zum Zitat He, P., Li, B., Liu, X., Chen, J., Ma, Y.: An empirical study on software defect prediction with a simplified metric set. Inf. Softw. Technol. 59, 170–190 (2015)CrossRef He, P., Li, B., Liu, X., Chen, J., Ma, Y.: An empirical study on software defect prediction with a simplified metric set. Inf. Softw. Technol. 59, 170–190 (2015)CrossRef
Zurück zum Zitat Herbold, S.: Training data selection for cross-project defect prediction. In: PROMISE’13, pp. 6–15 (2013) Herbold, S.: Training data selection for cross-project defect prediction. In: PROMISE’13, pp. 6–15 (2013)
Zurück zum Zitat Japkowicz, N., Stephen, S.: The class imbalance problem: a systematic study. Intell. Data Anal. 6(5), 429–449 (2002)MATH Japkowicz, N., Stephen, S.: The class imbalance problem: a systematic study. Intell. Data Anal. 6(5), 429–449 (2002)MATH
Zurück zum Zitat Jiang, Y., Cukic, B.: Misclassification cost-sensitive fault prediction models. In: PROMISE’09, pp. 1–10 (2009) Jiang, Y., Cukic, B.: Misclassification cost-sensitive fault prediction models. In: PROMISE’09, pp. 1–10 (2009)
Zurück zum Zitat Jiang, Y., Cukic, B., Ma, Y.: Techniques for evaluating fault prediction models. Empir. Softw. Eng. 13(5), 561–595 (2008a)CrossRef Jiang, Y., Cukic, B., Ma, Y.: Techniques for evaluating fault prediction models. Empir. Softw. Eng. 13(5), 561–595 (2008a)CrossRef
Zurück zum Zitat Jiang, Y., Cukic, B., Menzies, T.: Cost curve evaluation of fault prediction models. In: ISSRE’08, pp. 197–206 (2008b) Jiang, Y., Cukic, B., Menzies, T.: Cost curve evaluation of fault prediction models. In: ISSRE’08, pp. 197–206 (2008b)
Zurück zum Zitat Jiang, T., Tan, L., Kim, S.: Personalized defect prediction. In: ASE’13, pp. 279–289 (2013) Jiang, T., Tan, L., Kim, S.: Personalized defect prediction. In: ASE’13, pp. 279–289 (2013)
Zurück zum Zitat Jing, X.Y., Hu, R.M., Zhu, Y.P., Wu, S.S., Liang, C., Yang, J.Y.: Intra-view and inter-view supervised correlation analysis for multi-view feature learning. In: AAAI’14, pp. 1882–1889 (2014a) Jing, X.Y., Hu, R.M., Zhu, Y.P., Wu, S.S., Liang, C., Yang, J.Y.: Intra-view and inter-view supervised correlation analysis for multi-view feature learning. In: AAAI’14, pp. 1882–1889 (2014a)
Zurück zum Zitat Jing, X.Y., Ying, S., Zhang, Z.W., Wu, S.S., Liu, J.: Dictionary learning based software defect prediction. In: ICSE’14, pp. 414–423 (2014b) Jing, X.Y., Ying, S., Zhang, Z.W., Wu, S.S., Liu, J.: Dictionary learning based software defect prediction. In: ICSE’14, pp. 414–423 (2014b)
Zurück zum Zitat Jing, X.Y., Zhang, Z.W., Ying, S., Wang, F., Zhu, Y.P.: Software defect prediction based on collaborative representation classification. In: ICSE’14, pp. 632–633 (2014c) Jing, X.Y., Zhang, Z.W., Ying, S., Wang, F., Zhu, Y.P.: Software defect prediction based on collaborative representation classification. In: ICSE’14, pp. 632–633 (2014c)
Zurück zum Zitat Jing, X.Y., Wu, F., Dong, X., Qi, F., Xu, B.: Heterogeneous cross-company defect prediction by unified metric representation and cca-based transfer learning. In: ESEC/FSE’15, pp. 496–507 (2015) Jing, X.Y., Wu, F., Dong, X., Qi, F., Xu, B.: Heterogeneous cross-company defect prediction by unified metric representation and cca-based transfer learning. In: ESEC/FSE’15, pp. 496–507 (2015)
Zurück zum Zitat Kamei, Y., Shihab, E., Adams, B., Hassan, A.E., Mockus, A., Sinha, A., Ubayashi, N.: A large-scale empirical study of just-in-time quality assurance. IEEE Trans. Softw. Eng. 39(6), 757–773 (2013)CrossRef Kamei, Y., Shihab, E., Adams, B., Hassan, A.E., Mockus, A., Sinha, A., Ubayashi, N.: A large-scale empirical study of just-in-time quality assurance. IEEE Trans. Softw. Eng. 39(6), 757–773 (2013)CrossRef
Zurück zum Zitat Kamei, Y., Fukushima, T., Mcintosh, S., Yamashita, K., Ubayashi, N., Hassan, A.E.: Studying just-in-time defect prediction using cross-project models. Empir. Softw. Eng. 21(5), 2072–2106 (2016)CrossRef Kamei, Y., Fukushima, T., Mcintosh, S., Yamashita, K., Ubayashi, N., Hassan, A.E.: Studying just-in-time defect prediction using cross-project models. Empir. Softw. Eng. 21(5), 2072–2106 (2016)CrossRef
Zurück zum Zitat Khoshgoftaar, T.M., Geleyn, E., Nguyen, L., Bullard, L.: Cost-sensitive boosting in software quality modeling. In: ISHASE’02, pp. 51–60 (2002) Khoshgoftaar, T.M., Geleyn, E., Nguyen, L., Bullard, L.: Cost-sensitive boosting in software quality modeling. In: ISHASE’02, pp. 51–60 (2002)
Zurück zum Zitat Kim, T.K., Kittler, J., Cipolla, R.: Discriminative learning and recognition of image set classes using canonical correlations. IEEE Trans. Pattern Anal. Mach. Intell. 29(6), 1005–1018 (2007)CrossRef Kim, T.K., Kittler, J., Cipolla, R.: Discriminative learning and recognition of image set classes using canonical correlations. IEEE Trans. Pattern Anal. Mach. Intell. 29(6), 1005–1018 (2007)CrossRef
Zurück zum Zitat Kim, S., Zhang, H., Wu, R., Gong, L.: Dealing with noise in defect prediction. In: ICSE’11, pp. 481–490 (2011) Kim, S., Zhang, H., Wu, R., Gong, L.: Dealing with noise in defect prediction. In: ICSE’11, pp. 481–490 (2011)
Zurück zum Zitat Lai, P.L., Fyfe, C.: Kernel and nonlinear canonical correlation analysis. Int. J. Neural Syst. 10(05), 365–377 (2000)CrossRef Lai, P.L., Fyfe, C.: Kernel and nonlinear canonical correlation analysis. Int. J. Neural Syst. 10(05), 365–377 (2000)CrossRef
Zurück zum Zitat Lee, T., Nam, J., Han, D., Kim, S., In, H.: Developer micro interaction metrics for software defect prediction. IEEE Trans. Softw. Eng. 42(11), 1015–1035 (2016)CrossRef Lee, T., Nam, J., Han, D., Kim, S., In, H.: Developer micro interaction metrics for software defect prediction. IEEE Trans. Softw. Eng. 42(11), 1015–1035 (2016)CrossRef
Zurück zum Zitat Lessmann, S., Baesens, B., Mues, C., Pietsch, S.: Benchmarking classification models for software defect prediction: a proposed framework and novel findings. IEEE Trans. Softw. Eng. 34(4), 485–496 (2008)CrossRef Lessmann, S., Baesens, B., Mues, C., Pietsch, S.: Benchmarking classification models for software defect prediction: a proposed framework and novel findings. IEEE Trans. Softw. Eng. 34(4), 485–496 (2008)CrossRef
Zurück zum Zitat Li, Y.O., Adali, T., Wang, W., Calhoun, V.D.: Joint blind source separation by multiset canonical correlation analysis. IEEE Trans. Signal Process. 57(10), 3918–3929 (2009)MathSciNetCrossRef Li, Y.O., Adali, T., Wang, W., Calhoun, V.D.: Joint blind source separation by multiset canonical correlation analysis. IEEE Trans. Signal Process. 57(10), 3918–3929 (2009)MathSciNetCrossRef
Zurück zum Zitat Li, M., Zhang, H., Wu, R., Zhou, Z.H.: Sample-based software defect prediction with active and semi-supervised learning. Autom. Softw. Eng. 19(2), 201–230 (2012)CrossRef Li, M., Zhang, H., Wu, R., Zhou, Z.H.: Sample-based software defect prediction with active and semi-supervised learning. Autom. Softw. Eng. 19(2), 201–230 (2012)CrossRef
Zurück zum Zitat Liu, W., Wang, J., Ji, R., Jiang, Y.G., Chang, S.F.: Supervised hashing with kernels. In: CVPR’12, pp. 2074–2081 (2012) Liu, W., Wang, J., Ji, R., Jiang, Y.G., Chang, S.F.: Supervised hashing with kernels. In: CVPR’12, pp. 2074–2081 (2012)
Zurück zum Zitat Liu, M., Miao, L., Zhang, D.: Two-stage cost-sensitive learning for software defect prediction. IEEE Trans. Reliab. 63(2), 676–686 (2014)CrossRef Liu, M., Miao, L., Zhang, D.: Two-stage cost-sensitive learning for software defect prediction. IEEE Trans. Reliab. 63(2), 676–686 (2014)CrossRef
Zurück zum Zitat Lu, J., Tan, Y.P.: Cost-sensitive subspace analysis and extensions for face recognition. IEEE Trans. Inf. Forensics Secur. 8(3), 510–519 (2013)CrossRef Lu, J., Tan, Y.P.: Cost-sensitive subspace analysis and extensions for face recognition. IEEE Trans. Inf. Forensics Secur. 8(3), 510–519 (2013)CrossRef
Zurück zum Zitat Ma, Y., Luo, G., Zeng, X., Chen, A.: Transfer learning for cross-company software defect prediction. Inf. Softw. Technol. 54(3), 248–256 (2012)CrossRef Ma, Y., Luo, G., Zeng, X., Chen, A.: Transfer learning for cross-company software defect prediction. Inf. Softw. Technol. 54(3), 248–256 (2012)CrossRef
Zurück zum Zitat Menzies, T., Dekhtyar, A., Distefano, J., Greenwald, J.: Problems with precision: a response to “comments on ‘data mining static code attributes to learn defect predictors”’. IEEE Trans. Softw. Eng. 33(9), 635–636 (2007a)CrossRef Menzies, T., Dekhtyar, A., Distefano, J., Greenwald, J.: Problems with precision: a response to “comments on ‘data mining static code attributes to learn defect predictors”’. IEEE Trans. Softw. Eng. 33(9), 635–636 (2007a)CrossRef
Zurück zum Zitat Menzies, T., Greenwald, J., Frank, A.: Data mining static code attributes to learn defect predictors. IEEE Trans. Softw. Eng. 33(1), 2–13 (2007b)CrossRef Menzies, T., Greenwald, J., Frank, A.: Data mining static code attributes to learn defect predictors. IEEE Trans. Softw. Eng. 33(1), 2–13 (2007b)CrossRef
Zurück zum Zitat Menzies, T., Turhan, B., Bener, A., Gay, G., Cukic, B., Jiang, Y.: Implications of ceiling effects in defect predictors. In: PROMISE’08, pp. 47–54 (2008) Menzies, T., Turhan, B., Bener, A., Gay, G., Cukic, B., Jiang, Y.: Implications of ceiling effects in defect predictors. In: PROMISE’08, pp. 47–54 (2008)
Zurück zum Zitat Menzies, T., Milton, Z., Turhan, B., Cukic, B., Jiang, Y., Bener, A.: Defect prediction from static code features: current results, limitations, new approaches. Autom. Softw. Eng. 17(4), 375–407 (2010)CrossRef Menzies, T., Milton, Z., Turhan, B., Cukic, B., Jiang, Y., Bener, A.: Defect prediction from static code features: current results, limitations, new approaches. Autom. Softw. Eng. 17(4), 375–407 (2010)CrossRef
Zurück zum Zitat Menzies, T., Butcher, A., Cok, D., Marcus, A., Layman, L., Shull, F., Turhan, B., Zimmermann, T.: Local versus global lessons for defect prediction and effort estimation. IEEE Trans. Softw. Eng. 39(6), 822–834 (2013)CrossRef Menzies, T., Butcher, A., Cok, D., Marcus, A., Layman, L., Shull, F., Turhan, B., Zimmermann, T.: Local versus global lessons for defect prediction and effort estimation. IEEE Trans. Softw. Eng. 39(6), 822–834 (2013)CrossRef
Zurück zum Zitat Nam, J., Kim, S.: Clami: defect prediction on unlabeled datasets. In: ASE’15, pp. 1–12 (2015a) Nam, J., Kim, S.: Clami: defect prediction on unlabeled datasets. In: ASE’15, pp. 1–12 (2015a)
Zurück zum Zitat Nam, J., Kim, S.: Heterogeneous defect prediction. In: ESEC/FSE’15, pp. 508–519 (2015b) Nam, J., Kim, S.: Heterogeneous defect prediction. In: ESEC/FSE’15, pp. 508–519 (2015b)
Zurück zum Zitat Nam, J., Pan, S.J., Kim, S.: Transfer defect learning. In: ICSE’13, pp. 382–391 (2013) Nam, J., Pan, S.J., Kim, S.: Transfer defect learning. In: ICSE’13, pp. 382–391 (2013)
Zurück zum Zitat Pan, S.J., Yang, Q.: A survey on transfer learning. IEEE Trans. Knowl. Data Eng. 22(10), 1345–1359 (2010)CrossRef Pan, S.J., Yang, Q.: A survey on transfer learning. IEEE Trans. Knowl. Data Eng. 22(10), 1345–1359 (2010)CrossRef
Zurück zum Zitat Panichella, A., Oliveto, R., De Lucia, A.: Cross-project defect prediction models: L’union fait la force. In: CSMR-WCRE’14, pp. 164–173 (2014) Panichella, A., Oliveto, R., De Lucia, A.: Cross-project defect prediction models: L’union fait la force. In: CSMR-WCRE’14, pp. 164–173 (2014)
Zurück zum Zitat Pelayo, L., Dick, S.: Evaluating stratification alternatives to improve software defect prediction. IEEE Trans. Reliab. 61(61), 516–525 (2012)CrossRef Pelayo, L., Dick, S.: Evaluating stratification alternatives to improve software defect prediction. IEEE Trans. Reliab. 61(61), 516–525 (2012)CrossRef
Zurück zum Zitat Peters, F., Menzies, T., Gong, L., Zhang, H.: Balancing privacy and utility in cross-company defect prediction. IEEE Trans. Softw. Eng. 39(8), 1054–1068 (2013a)CrossRef Peters, F., Menzies, T., Gong, L., Zhang, H.: Balancing privacy and utility in cross-company defect prediction. IEEE Trans. Softw. Eng. 39(8), 1054–1068 (2013a)CrossRef
Zurück zum Zitat Peters, F., Menzies, T., Marcus, A.: Better cross company defect prediction. In: MSR’13, pp. 409–418 (2013b) Peters, F., Menzies, T., Marcus, A.: Better cross company defect prediction. In: MSR’13, pp. 409–418 (2013b)
Zurück zum Zitat Peters, F., Menzies, T., Layman, L.: Lace2: Better privacy-preserving data sharing for cross project defect prediction. In: ICSE’15, pp. 801–811 (2015) Peters, F., Menzies, T., Layman, L.: Lace2: Better privacy-preserving data sharing for cross project defect prediction. In: ICSE’15, pp. 801–811 (2015)
Zurück zum Zitat Rahman, F., Posnett, D., Devanbu, P.: Recalling the imprecision of cross-project defect prediction. In: ESEC/FSE’12, pp. 1–11 (2012) Rahman, F., Posnett, D., Devanbu, P.: Recalling the imprecision of cross-project defect prediction. In: ESEC/FSE’12, pp. 1–11 (2012)
Zurück zum Zitat Ren, J., Qin, K., Ma, Y., Luo, G.: On software defect prediction using machine learning. J. Appl. Math. 2014(3), 201–211 (2014)MathSciNet Ren, J., Qin, K., Ma, Y., Luo, G.: On software defect prediction using machine learning. J. Appl. Math. 2014(3), 201–211 (2014)MathSciNet
Zurück zum Zitat Ryu, D., Jang, J.I., Baik, J.: A transfer cost-sensitive boosting approach for cross-project defect prediction. Softw. Qual. J. 25(1), 235–272 (2017)CrossRef Ryu, D., Jang, J.I., Baik, J.: A transfer cost-sensitive boosting approach for cross-project defect prediction. Softw. Qual. J. 25(1), 235–272 (2017)CrossRef
Zurück zum Zitat Ryu, D., Choi, O., Baik, J.: Value-cognitive boosting with a support vector machine for cross-project defect prediction. Empir. Softw. Eng. 21(1), 43–71 (2016)CrossRef Ryu, D., Choi, O., Baik, J.: Value-cognitive boosting with a support vector machine for cross-project defect prediction. Empir. Softw. Eng. 21(1), 43–71 (2016)CrossRef
Zurück zum Zitat Seiffert, C., Khoshgoftaar, T.M., Van Hulse, J.: Improving software-quality predictions with data sampling and boosting. IEEE Trans. Syst. Man Cybern. A Syst. Hum. 39(6), 1283–1294 (2009)CrossRef Seiffert, C., Khoshgoftaar, T.M., Van Hulse, J.: Improving software-quality predictions with data sampling and boosting. IEEE Trans. Syst. Man Cybern. A Syst. Hum. 39(6), 1283–1294 (2009)CrossRef
Zurück zum Zitat Shepperd, M., Song, Q., Sun, Z., Mair, C.: Data quality: some comments on the nasa software defect datasets. IEEE Trans. Softw. Eng. 39(9), 1208–1215 (2013)CrossRef Shepperd, M., Song, Q., Sun, Z., Mair, C.: Data quality: some comments on the nasa software defect datasets. IEEE Trans. Softw. Eng. 39(9), 1208–1215 (2013)CrossRef
Zurück zum Zitat Shepperd, M., Bowes, D., Hall, T.: Researcher bias: the use of machine learning in software defect prediction. IEEE Trans. Softw. Eng. 40(6), 603–616 (2014)CrossRef Shepperd, M., Bowes, D., Hall, T.: Researcher bias: the use of machine learning in software defect prediction. IEEE Trans. Softw. Eng. 40(6), 603–616 (2014)CrossRef
Zurück zum Zitat Shivaji, S., Whitehead, E.J., Akella, R., Kim, S.: Reducing features to improve code change-based bug prediction. IEEE Trans. Softw. Eng. 39(4), 552–569 (2013)CrossRef Shivaji, S., Whitehead, E.J., Akella, R., Kim, S.: Reducing features to improve code change-based bug prediction. IEEE Trans. Softw. Eng. 39(4), 552–569 (2013)CrossRef
Zurück zum Zitat Sun, Z., Song, Q., Zhu, X.: Using coding-based ensemble learning to improve software defect prediction. IEEE Trans. Syst. Man Cybern. C Appl. Rev. 42(6), 1806–1817 (2012)CrossRef Sun, Z., Song, Q., Zhu, X.: Using coding-based ensemble learning to improve software defect prediction. IEEE Trans. Syst. Man Cybern. C Appl. Rev. 42(6), 1806–1817 (2012)CrossRef
Zurück zum Zitat Tan, M., Tan, L., Dara, S., Mayeux, C.: Online defect prediction for imbalanced data. In: ICSE’15, pp. 99–108(2015) Tan, M., Tan, L., Dara, S., Mayeux, C.: Online defect prediction for imbalanced data. In: ICSE’15, pp. 99–108(2015)
Zurück zum Zitat Tantithamthavorn, C., McIntosh, S., Hassan, A.E., Ihara, A., Matsumoto, K.: The impact of mislabelling on the performance and interpretation of defect prediction models. In: ICSE’15, pp. 812–823 (2015) Tantithamthavorn, C., McIntosh, S., Hassan, A.E., Ihara, A., Matsumoto, K.: The impact of mislabelling on the performance and interpretation of defect prediction models. In: ICSE’15, pp. 812–823 (2015)
Zurück zum Zitat Tantithamthavorn, C., McIntosh, S., Hassan, A.E., Matsumoto, K.: Automated parameter optimization of classification techniques for defect prediction models. In: ICSE’16, pp. 321–332 (2016) Tantithamthavorn, C., McIntosh, S., Hassan, A.E., Matsumoto, K.: Automated parameter optimization of classification techniques for defect prediction models. In: ICSE’16, pp. 321–332 (2016)
Zurück zum Zitat Thiagarajan, J.J., Ramamurthy, K.N., Spanias, A.: Multiple kernel sparse representations for supervised and unsupervised learning. IEEE Trans. Image Process. 23(7), 2905–2915 (2014)MathSciNetMATHCrossRef Thiagarajan, J.J., Ramamurthy, K.N., Spanias, A.: Multiple kernel sparse representations for supervised and unsupervised learning. IEEE Trans. Image Process. 23(7), 2905–2915 (2014)MathSciNetMATHCrossRef
Zurück zum Zitat Thompson, B.: Canonical Correlation Analysis: Uses and Interpretation, vol. 47. Sage, Beverly Hills (1984)CrossRef Thompson, B.: Canonical Correlation Analysis: Uses and Interpretation, vol. 47. Sage, Beverly Hills (1984)CrossRef
Zurück zum Zitat Tosun, A., Bener, A., Turhan, B., Menzies, T.: Practical considerations in deploying statistical methods for defect prediction: a case study within the turkish telecommunications industry. Inf. Softw. Technol. 52(11), 1242–1257 (2010)CrossRef Tosun, A., Bener, A., Turhan, B., Menzies, T.: Practical considerations in deploying statistical methods for defect prediction: a case study within the turkish telecommunications industry. Inf. Softw. Technol. 52(11), 1242–1257 (2010)CrossRef
Zurück zum Zitat Turhan, B., Menzies, T., Bener, A.B., Di Stefano, J.: On the relative value of cross-company and within-company data for defect prediction. Empir. Softw. Eng. 14(5), 540–578 (2009)CrossRef Turhan, B., Menzies, T., Bener, A.B., Di Stefano, J.: On the relative value of cross-company and within-company data for defect prediction. Empir. Softw. Eng. 14(5), 540–578 (2009)CrossRef
Zurück zum Zitat Turhan, B., Mısırlı, A.T., Bener, A.: Empirical evaluation of the effects of mixed project data on learning defect predictors. Inf. Softw. Technol. 55(6), 1101–1118 (2013)CrossRef Turhan, B., Mısırlı, A.T., Bener, A.: Empirical evaluation of the effects of mixed project data on learning defect predictors. Inf. Softw. Technol. 55(6), 1101–1118 (2013)CrossRef
Zurück zum Zitat Vaerenbergh, S.V.: Kernel Methods for Nonlinear Identification, Equalization and Separation of Signals. Universidad de Cantabria, santander (2010) Vaerenbergh, S.V.: Kernel Methods for Nonlinear Identification, Equalization and Separation of Signals. Universidad de Cantabria, santander (2010)
Zurück zum Zitat Wang, S., Yao, X.: Using class imbalance learning for software defect prediction. IEEE Trans. Reliab. 62(2), 434–443 (2013)CrossRef Wang, S., Yao, X.: Using class imbalance learning for software defect prediction. IEEE Trans. Reliab. 62(2), 434–443 (2013)CrossRef
Zurück zum Zitat Wang, S., Liu, T., Tan, L.: Automatically learning semantic features for defect prediction. In: ICSE’16, pp. 297–308 (2016a) Wang, S., Liu, T., Tan, L.: Automatically learning semantic features for defect prediction. In: ICSE’16, pp. 297–308 (2016a)
Zurück zum Zitat Wang, T.J., Zhang, Z.W., Jing, X.Y., Zhang, L.Q.: Multiple kernel ensemble learning for software defect prediction. Autom. Softw. Eng. 23(4), 569–590 (2016b)CrossRef Wang, T.J., Zhang, Z.W., Jing, X.Y., Zhang, L.Q.: Multiple kernel ensemble learning for software defect prediction. Autom. Softw. Eng. 23(4), 569–590 (2016b)CrossRef
Zurück zum Zitat Watanabe, S., Kaiya, H., Kaijiri, K.: Adapting a fault prediction model to allow inter languagereuse. In: PROMISE’08, pp. 19–24 (2008) Watanabe, S., Kaiya, H., Kaijiri, K.: Adapting a fault prediction model to allow inter languagereuse. In: PROMISE’08, pp. 19–24 (2008)
Zurück zum Zitat Weston, J., Elisseeff, A., Schölkopf, B., Tipping, M.: Use of the zero norm with linear models and kernel methods. J. Mach. Learn. Res. 3, 1439–1461 (2003)MathSciNetMATH Weston, J., Elisseeff, A., Schölkopf, B., Tipping, M.: Use of the zero norm with linear models and kernel methods. J. Mach. Learn. Res. 3, 1439–1461 (2003)MathSciNetMATH
Zurück zum Zitat Wu, R., Zhang, H., Kim, S., Cheung, S.C.: Relink: recovering links between bugs and changes. In: ESEC/FSE’11, pp. 15–25 (2011) Wu, R., Zhang, H., Kim, S., Cheung, S.C.: Relink: recovering links between bugs and changes. In: ESEC/FSE’11, pp. 15–25 (2011)
Zurück zum Zitat Wu, X., Wang, H., Liu, C., Jia, Y.: Cross-view action recognition over heterogeneous feature spaces. IEEE Trans. Image Process. 24(11), 4096–4108 (2015)MathSciNetCrossRef Wu, X., Wang, H., Liu, C., Jia, Y.: Cross-view action recognition over heterogeneous feature spaces. IEEE Trans. Image Process. 24(11), 4096–4108 (2015)MathSciNetCrossRef
Zurück zum Zitat Xia, X., Lo, D., McIntosh, S., Shihab, E., Hassan, A.E.: Cross-project build co-change prediction. In: SANER’15, pp. 311–320 (2015) Xia, X., Lo, D., McIntosh, S., Shihab, E., Hassan, A.E.: Cross-project build co-change prediction. In: SANER’15, pp. 311–320 (2015)
Zurück zum Zitat Xia, X., Lo, D., Pan, S.J., Nagappan, N., Wang, X.: Hydra: massively compositional model for cross-project defect prediction. IEEE Trans. Softw. Eng. 42(10), 977–998 (2016)CrossRef Xia, X., Lo, D., Pan, S.J., Nagappan, N., Wang, X.: Hydra: massively compositional model for cross-project defect prediction. IEEE Trans. Softw. Eng. 42(10), 977–998 (2016)CrossRef
Zurück zum Zitat Yeh, Y.R., Huang, C.H., Wang, Y.C.F.: Heterogeneous domain adaptation and classification by exploiting the correlation subspace. IEEE Trans. Image Process. 23(5), 2009–2018 (2014)MathSciNetMATHCrossRef Yeh, Y.R., Huang, C.H., Wang, Y.C.F.: Heterogeneous domain adaptation and classification by exploiting the correlation subspace. IEEE Trans. Image Process. 23(5), 2009–2018 (2014)MathSciNetMATHCrossRef
Zurück zum Zitat Ying, M., Guangchun, L., Hao, C.: Kernel based asymmetric learning for software defect prediction. IEICE Trans. Inf. Syst. 95(1), 267–270 (2012) Ying, M., Guangchun, L., Hao, C.: Kernel based asymmetric learning for software defect prediction. IEICE Trans. Inf. Syst. 95(1), 267–270 (2012)
Zurück zum Zitat You, D., Hamsici, O.C., Martinez, A.M.: Kernel optimization in discriminant analysis. IEEE Trans. Pattern Anal. Mach. Intell. 33(3), 631–638 (2011)CrossRef You, D., Hamsici, O.C., Martinez, A.M.: Kernel optimization in discriminant analysis. IEEE Trans. Pattern Anal. Mach. Intell. 33(3), 631–638 (2011)CrossRef
Zurück zum Zitat Zhang, H., Zhang, X.: Comments on “data mining static code attributes to learn defect predictors”. IEEE Trans. Softw. Eng. 33(9), 635–637 (2007)CrossRef Zhang, H., Zhang, X.: Comments on “data mining static code attributes to learn defect predictors”. IEEE Trans. Softw. Eng. 33(9), 635–637 (2007)CrossRef
Zurück zum Zitat Zhang, B., Shi, Z.Z.: Classification of big velocity data via cross-domain canonical correlation analysis. In: ICBD’13, pp. 493–498 (2013) Zhang, B., Shi, Z.Z.: Classification of big velocity data via cross-domain canonical correlation analysis. In: ICBD’13, pp. 493–498 (2013)
Zurück zum Zitat Zhang, F., Mockus, A., Keivanloo, I., Zou, Y.: Towards building a universal defect prediction model with rank transformed predictors. Empir. Softw. Eng. 21(5), 1–39 (2016a)CrossRef Zhang, F., Mockus, A., Keivanloo, I., Zou, Y.: Towards building a universal defect prediction model with rank transformed predictors. Empir. Softw. Eng. 21(5), 1–39 (2016a)CrossRef
Zurück zum Zitat Zhang, F., Zheng, Q., Zou, Y., Hassan, A.E.: Cross-project defect prediction using a connectivity-based unsupervised classifier. In: ICSE’16, pp. 309–320 (2016b) Zhang, F., Zheng, Q., Zou, Y., Hassan, A.E.: Cross-project defect prediction using a connectivity-based unsupervised classifier. In: ICSE’16, pp. 309–320 (2016b)
Zurück zum Zitat Zhang, Z.W., Jing, X.Y., Wang, T.J.: Label propagation based semi-supervised learning for software defect prediction. Autom. Softw. Eng. 24(1), 47–69 (2017)CrossRef Zhang, Z.W., Jing, X.Y., Wang, T.J.: Label propagation based semi-supervised learning for software defect prediction. Autom. Softw. Eng. 24(1), 47–69 (2017)CrossRef
Zurück zum Zitat Zheng, J.: Cost-sensitive boosting neural networks for software defect prediction. Expert Syst. Appl. 37(6), 4537–4543 (2010)CrossRef Zheng, J.: Cost-sensitive boosting neural networks for software defect prediction. Expert Syst. Appl. 37(6), 4537–4543 (2010)CrossRef
Zurück zum Zitat Zhou, D., Bousquet, O., Lal, T.N., Weston, J., Schölkopf, B.: Learning with local and global consistency. NIPS’04 16(16), 321–328 (2004) Zhou, D., Bousquet, O., Lal, T.N., Weston, J., Schölkopf, B.: Learning with local and global consistency. NIPS’04 16(16), 321–328 (2004)
Zurück zum Zitat Zimmermann, T., Nagappan, N., Gall, H., Giger, E., Murphy, B.: Cross-project defect prediction: a large scale experiment on data vs. domain vs. process. In: ESEC/FSE’09, pp. 91–100 (2009) Zimmermann, T., Nagappan, N., Gall, H., Giger, E., Murphy, B.: Cross-project defect prediction: a large scale experiment on data vs. domain vs. process. In: ESEC/FSE’09, pp. 91–100 (2009)
Metadaten
Titel
Cost-sensitive transfer kernel canonical correlation analysis for heterogeneous defect prediction
verfasst von
Zhiqiang Li
Xiao-Yuan Jing
Fei Wu
Xiaoke Zhu
Baowen Xu
Shi Ying
Publikationsdatum
16.08.2017
Verlag
Springer US
Erschienen in
Automated Software Engineering / Ausgabe 2/2018
Print ISSN: 0928-8910
Elektronische ISSN: 1573-7535
DOI
https://doi.org/10.1007/s10515-017-0220-7

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