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Erschienen in:
2008 | OriginalPaper | Buchkapitel
Detection of a Large Number of Overlapping Ellipses Immersed in Noise
verfasst von : Armando Manuel Fernandes
Erschienen in: Advances in Visual Computing
Verlag: Springer Berlin Heidelberg
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A new algorithm able to efficiently detect a large number of overlapping ellipses with a reduced number of false positives is described. The algorithm estimates the number of candidate ellipse centers in an image with the help of a 2-dimensional accumulator and determines the five ellipse parameters with an ellipse fitting algorithm. The proposed ellipse detection algorithm uses a heuristic to select, among all image points, those with greater probabilities of belonging to an ellipse. This leads to an increase in classification efficiency, even in the presence of noise. Testing has shown that the proposed algorithm detected 97.4% of the ellipses in 100 images. Each image contained ten overlapping ellipses surrounded by noise. The ellipse parameters were determined with great accuracy.