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Erschienen in:
2018 | OriginalPaper | Buchkapitel
Development of 3D Surface Shape Analysis System Using White Light Scanning Interference
verfasst von : Yong-Tae Jeon, Hyun Lee, Jae Sung Choi
Erschienen in: Advances in Computer Science and Ubiquitous Computing
Verlag: Springer Singapore
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Abstract
Due to the rapid development of the industry in recent years, there is a growing demand for precise machine of parts. It is also necessary to analyze the processed products precisely in order to efficiently operate the machines in the production plant. In order to guarantee the precise of the part production, it must be possible to distinguish microscopic differences that cannot be judged by human eyes. In previous studies, only two-dimensional analysis was possible, and the analyzable system was PCB circuit eccentricity, width, diameter of circle. However, for production of precise products, it is difficult to analyze the product in two dimensions. Therefore, in this paper, we propose an extended analytical system that adds three - dimensional shape to the product so that the accuracy of the product can be clearly judged in the 2D method by providing the three - dimensional shape of the product and realizing the actual sectional shape through 3D.