2007 | OriginalPaper | Buchkapitel
Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features
Erschienen in: Digital Noise Monitoring of Defect Origin
Verlag: Springer US
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
Reasons for the rise of defects on various objects such as living organisms and equipment are the subject of much research of corresponding science directions. However, considering these problems in view of obtaining information and methods of analysis, monitoring, and diagnostics, one can notice that the problems have much in common. In many cases, the signals describing the current state are obtained from the sensors installed on the corresponding objects. Similar or nearly the same information technologies are used in different areas for analyzing these signals as the information carriers. These technologies are realized on the same modern computers. Taking this into account, the IT specialist does not consider the differences in solving the problem of monitoring the state of these objects despite the wide areas of specific features of each object.