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Erschienen in:
2004 | OriginalPaper | Buchkapitel
Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces
verfasst von : S. V. Kalinin, D. A. Bonnell
Erschienen in: Nanoscale Characterisation of Ferroelectric Materials
Verlag: Springer Berlin Heidelberg
Enthalten in: Professional Book Archive
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Recent progress in oxide electronic devices including microelectromechanical systems (MEMS), non-volatile ferroelectric memories (FeRAMs), and ferroelectric heterostructures necessitates an understanding of local ferroelectric properties on the nanometer level. This has motivated a number of studies of ferroelectric materials with various scanning probe microscopies (SPM) [l–3], many examples of which can be found in this text. The natures of the probe and contrast formation mechanisms in these techniques are vastly different; therefore, SPM images reflect different properties of ferroelectric surfaces.