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Erschienen in:
2012 | OriginalPaper | Buchkapitel
EM Probes Characterisation for Security Analysis
verfasst von : Benjamin Mounier, Anne-Lise Ribotta, Jacques Fournier, Michel Agoyan, Assia Tria
Erschienen in: Cryptography and Security: From Theory to Applications
Verlag: Springer Berlin Heidelberg
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Along with the vast use of cryptography in security devices came the emergence of attacks like Electro-Magnetic analysis (EMA) where the measurement of the Electro-Magnetic (EM) waves radiated from an integrated circuit are used to extract sensitive information. Several research papers have covered EMA but very few have focused on the probes used. In this paper we detail an approach for analysing different probes for EMA. We perform the characterisation of several EM probes on elementary circuits like an isolated copper wire and silicon lines. We then illustrate how EM probes can be characterised based on data dependant information leakage of integrated circuits by doing measurements on a smart card like chip. We show that the latter results are in line with those obtained from the measurements on the elementary circuits, onto which detailed and more precise analyses can be carried.