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2018 | OriginalPaper | Buchkapitel

2. In Situ X-Ray Studies of Crystallization Kinetics and Ordering in Functional Organic and Hybrid Materials

verfasst von : Bin Yang, Jong K. Keum, David B. Geohegan, Kai Xiao

Erschienen in: In-situ Characterization Techniques for Nanomaterials

Verlag: Springer Berlin Heidelberg

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Abstract

In-Situ and time-resolved X-ray scattering and diffraction is dedicated to yielding the change of structural information as the materials are processed or grown in a controlled environment. In this chapter, we introduce the use of in situ and time-resolved X-ray techniques to understand molecular packing, crystal orientation, and phase transformation during the synthesis and processing of functional organic semiconductors, organic nanowires, and hybrid perovskite materials.

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Vorheriges Kapitel Liquid Cell Electron Microscopy for the Study of Growth Dynamics of Nanomaterials and Structure of Soft Matter

Nächstes Kapitel Wide-Field Surface Plasmon Resonance Microscopy for In-Situ Characterization of Nanoparticle Suspensions

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Titel: In Situ X-Ray Studies of Crystallization Kinetics and Ordering in Functional Organic and Hybrid Materials
verfasst von: Bin Yang
Jong K. Keum
David B. Geohegan
Kai Xiao
Verlag: Springer Berlin Heidelberg
Buch: In-situ Characterization Techniques for Nanomaterials
Print ISBN: 978-3-662-56321-2

Electronic ISBN: 978-3-662-56322-9

Copyright-Jahr: 2018
DOI: https://doi.org/10.1007/978-3-662-56322-9_2

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