1987 | OriginalPaper | Buchkapitel
Image Understanding Strategies: Application to Electron Microscopy
verfasst von : Jean-Michel Jolion, Patrick Prevot
Erschienen in: Pattern Recognition Theory and Applications
Verlag: Springer Berlin Heidelberg
Enthalten in: Professional Book Archive
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This paper examine the problems of designing image analysis systems capable of providing morphological and geometrical measurements on a specific phenomenon. Several strategies for designing such a system are presented. One of these is applied to the design of a system for physicist users which allows access to some quantitative information. This information is already present in the image but, in the past, it could not be used due to a lack of suitable tools. These data are important for research on material mechanical property optimization. Finally, we present a prototyping tool which facilitates the design stage of analysis system.