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$Present State of Electron Backscatter Diffraction and Prospective Developments$ Kapitel lesen Erstes Kapitel lesen

2009 | OriginalPaper | Buchkapitel

18. Mapping and Assessing Plastic Deformation Using EBSD

verfasst von : Luke N. Brewer, David P. Field, Colin C. Merriman

Erschienen in: Electron Backscatter Diffraction in Materials Science

Verlag: Springer US

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This chapter reviews approaches for mapping and assessing plastic deformation using EBSD. This discussion will be focused on the approaches based upon EBSD pattern rotation. Pattern rotation can be mapped or quantified in terms of straight orientation change, local misorientation, average misorientation, or the calculation of geometrically necessary dislocation densities. In polycrystals, the misorientation can be mapped using several different kinds of metrics to visualize plastic deformation around cracks, indentations, and inside deformed grains. We will discuss a number of average misorientation metrics that have been developed to quantify the correlation between plastic deformation and EBSD data. Finally, we will survey the more recent work in the measurement and display of geometrically necessary dislocations and their connection to deformation structures in metals.

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Vorheriges Kapitel Strain Mapping Using Electron Backscatter Diffraction

Nächstes Kapitel Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques

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Titel: Mapping and Assessing Plastic Deformation Using EBSD
verfasst von: Luke N. Brewer
David P. Field
Colin C. Merriman
Verlag: Springer US
Buch: Electron Backscatter Diffraction in Materials Science
Print ISBN: 978-0-387-88135-5

Electronic ISBN: 978-0-387-88136-2

Copyright-Jahr: 2009
DOI: https://doi.org/10.1007/978-0-387-88136-2_18

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