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2006 | Buch

Handbook of Practical X-Ray Fluorescence Analysis

herausgegeben von: Dr. Burkhard Beckhoff, Dr. habil. Birgit Kanngießer, Professor Dr. Norbert Langhoff, Dr. sc. nat. Reiner Wedell, Dr. sc. nat. Helmut Wolff

Verlag: Springer Berlin Heidelberg

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Über dieses Buch

X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each section is largely self-contained.

Inhaltsverzeichnis

Frontmatter
1. Introduction
Tomoya Arai
2. X-Ray Sources
Norbert Langhoff, Alexandre Simionovici, Vladimir Arkadiev, Wolfgang Knüpfer, Tomáš Čechák, Jürgen Leonhardt, Joël Chavanne
3. X-Ray Optics
Alexei Erko, Vladimir Arkadiev, Aniouar Bjeoumikhov, Alexander Antonov, Burkhard Beckhoff, Inna Grigorieva, habil. Birgit Kanngießer, Bernard Vidal
4. X-Ray Detectors and XRF Detection Channels
Frank Scholze, Antonio Longoni, Carlo Fiorini, Lothar Strüder, Norbert Meidinger, Robert Hartmann, Naoki Kawahara, Takashi Shoji
5. Quantitative Analysis
Michael Mantler, James Willis, Gerald Lachance, Bruno A. R. Vrebos, Karl-Eugen Mauser, Naoki Kawahara, Richard M. Rousseau, Peter N. Brouwer
6. Specimen Preparation
Jasna Injuk, RenÉ Van Grieken, Avram Blank, Lyudmyla Eksperiandova, Victor Buhrke
7. Methodological Developments and Applications
Birgit Kanngießer, Michael Haschke, Alexandre Simionovici, Pierre Chevallier, Christina Streli, Peter Wobrauschek, Laszlo Fabry, Siegfried Pahlke, Fabio Comin, Ray Barrett, Pietro Pianetta, Katharina Lüning, Burkhard Beckhoff, Volker Rößiger, Bernd Nensel, Sandor Kurunczi, János Osán, Szabina Török, Maria Betti, Dieter Rammlmair, Max Wilke, Karen Rickers, Robert A. Schwarzer, Andreas Möller, Antje Wittenberg, Oliver Hahn, Ina Reiche, Heike Stege, Jörg Engelhardt, Janina Zieba-Palus, Gundolf Weseloh, Susanne Staub, Joachim Feuerborn, Peter Hoffmann
8. Appendix
Peter Ambrosi, Reiner Wedell, Wolfgang Malzer
Backmatter
Metadaten
Titel
Handbook of Practical X-Ray Fluorescence Analysis
herausgegeben von
Dr. Burkhard Beckhoff
Dr. habil. Birgit Kanngießer
Professor Dr. Norbert Langhoff
Dr. sc. nat. Reiner Wedell
Dr. sc. nat. Helmut Wolff
Copyright-Jahr
2006
Verlag
Springer Berlin Heidelberg
Electronic ISBN
978-3-540-36722-2
Print ISBN
978-3-540-28603-5
DOI
https://doi.org/10.1007/978-3-540-36722-2

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