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Erschienen in: Optical and Quantum Electronics 5/2013

01.05.2013

Measurement of phases and amplitudes of AWG by fitting interference intensities

verfasst von: Sungwoo Lim, Yong Ho Oh, Chun Soo Go

Erschienen in: Optical and Quantum Electronics | Ausgabe 5/2013

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Abstract

We measured the phases and amplitudes of an arrayed waveguide grating (AWG) by fitting interference intensities via a frequency domain method. The intensities were recorded as a function of the laser frequency in an interferometer containing the AWG. We fit the theoretical intensity profile to the recorded data via the Monte-Carlo method after filtering out the low-frequency noise. The phases and amplitudes are the parameters in the fitting process, and hence, the values are determined from the final fit. The variations in the measured phase values with the change in the initial condition of the Monte-Carlo process were less than \(0.1^\circ \). The variations in the measured amplitude values were negligible. In order to verify our measurement, we calculated the transmission spectrum of the AWG using the measured phases and amplitudes and compared it with a directly measured spectrum. The calculated and measured spectrums are in good agreement with each other.

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Literatur
Zurück zum Zitat Chen, W., Chen, Y.J., Yan, M., McGinnis, B., Wu, Z.: Improved techniques for the measurement of phase error in waveguide based optical devices. J. Lightwave Technol. 21, 198–205 (2003)ADSCrossRef Chen, W., Chen, Y.J., Yan, M., McGinnis, B., Wu, Z.: Improved techniques for the measurement of phase error in waveguide based optical devices. J. Lightwave Technol. 21, 198–205 (2003)ADSCrossRef
Zurück zum Zitat Doerr, C.R., Okamoto, K.: Advances in silica planar lightwave circuit. J. Lightwave Technol. 24, 4763–4789 (2006)ADSCrossRef Doerr, C.R., Okamoto, K.: Advances in silica planar lightwave circuit. J. Lightwave Technol. 24, 4763–4789 (2006)ADSCrossRef
Zurück zum Zitat Lazaro, J.A., Wessel, R., Koppenborg, J., Dudziak, G., Blewett, I.J.: Inverse fourier tramsform method for characterizing arrayed-waveguide grating. IEEE Photon. Technol. Lett. 15, 93–95 (2003)ADSCrossRef Lazaro, J.A., Wessel, R., Koppenborg, J., Dudziak, G., Blewett, I.J.: Inverse fourier tramsform method for characterizing arrayed-waveguide grating. IEEE Photon. Technol. Lett. 15, 93–95 (2003)ADSCrossRef
Zurück zum Zitat Oh, Y.H., Lim, S., Go, C.S.: Alternative method of AWG phase measurement based on fitting interference intensity. J. Opt. Soc. Korea 16, 91–94 (2012)CrossRef Oh, Y.H., Lim, S., Go, C.S.: Alternative method of AWG phase measurement based on fitting interference intensity. J. Opt. Soc. Korea 16, 91–94 (2012)CrossRef
Zurück zum Zitat Sim, E.C., Abbou, F.M., Faidz, A.R.: System degradation due to phase error induced crosstalk in WDM optical networks employing arrayed waveguide grating multi/demultiplexer. Opt. Quantum Electron. 39, 553–560 (2007)CrossRef Sim, E.C., Abbou, F.M., Faidz, A.R.: System degradation due to phase error induced crosstalk in WDM optical networks employing arrayed waveguide grating multi/demultiplexer. Opt. Quantum Electron. 39, 553–560 (2007)CrossRef
Zurück zum Zitat Smit, M.K., Dam, C.V.: Phasar-based WDM-devices: principles, design and applications. IEEE J. Sel. Top. Quantum Electron. 2, 236–250 (1996)CrossRef Smit, M.K., Dam, C.V.: Phasar-based WDM-devices: principles, design and applications. IEEE J. Sel. Top. Quantum Electron. 2, 236–250 (1996)CrossRef
Zurück zum Zitat Takada, K., Takada, Y., Yokota, A., Satoh, S.: Metal mask fabrication with an inkjet printer for AWG phase trimming using a photosensitive refractive index change. IEEE Photon. Technol. Lett. 17, 813–815 (2005)ADSCrossRef Takada, K., Takada, Y., Yokota, A., Satoh, S.: Metal mask fabrication with an inkjet printer for AWG phase trimming using a photosensitive refractive index change. IEEE Photon. Technol. Lett. 17, 813–815 (2005)ADSCrossRef
Zurück zum Zitat Takada, K., Abe, M., Shibata, M., Ishii, M., Okamoto, K.: Low-corsstalk 10-GHz-spaced 512-channel arrayed-waveguide grating multi/demultiplexer fabricated on a 4-in wafer. IEEE Photon. Technol. Lett. 13, 1182–1184 (2001)ADSCrossRef Takada, K., Abe, M., Shibata, M., Ishii, M., Okamoto, K.: Low-corsstalk 10-GHz-spaced 512-channel arrayed-waveguide grating multi/demultiplexer fabricated on a 4-in wafer. IEEE Photon. Technol. Lett. 13, 1182–1184 (2001)ADSCrossRef
Zurück zum Zitat Takada, K., Yamada, H., Inoue, Y.: Optical low coherence method for characterizing silica-based arrayed-waveguide gratings multiplexers. J. Lightwave Technol. 14, 1677–1689 (1996) Takada, K., Yamada, H., Inoue, Y.: Optical low coherence method for characterizing silica-based arrayed-waveguide gratings multiplexers. J. Lightwave Technol. 14, 1677–1689 (1996)
Zurück zum Zitat Takada, K., Okamoto, K.: Frequency-domain measurement of phase error distribution in narrow-channel arrayed waveguide grating. Electron. Lett. 36, 160–161 (2000) Takada, K., Okamoto, K.: Frequency-domain measurement of phase error distribution in narrow-channel arrayed waveguide grating. Electron. Lett. 36, 160–161 (2000)
Zurück zum Zitat Takada, K., Satoh, S.: Method for measuring the phase error distribution of a wideband arrayed waveguide grating in the frequency domain. Opt. Lett. 31, 323–325 (2006)ADSCrossRef Takada, K., Satoh, S.: Method for measuring the phase error distribution of a wideband arrayed waveguide grating in the frequency domain. Opt. Lett. 31, 323–325 (2006)ADSCrossRef
Zurück zum Zitat Takada, K., Hirose, T.: Phase modulation method for AWG phase-error measurement in the frequency domain. Opt. Lett. 34, 3914–3916 (2009)ADSCrossRef Takada, K., Hirose, T.: Phase modulation method for AWG phase-error measurement in the frequency domain. Opt. Lett. 34, 3914–3916 (2009)ADSCrossRef
Zurück zum Zitat Yamada, H., Sanjoh, H., Kohtoku, M., Takada, K., Okamoto, K.: Measurement of phase and amplitude error distributions in arrayed-waveguide grating multi/demultiplexers based on dispersive waveguide. J. Lightwave Technol. 18, 1309–1320 (2000)ADSCrossRef Yamada, H., Sanjoh, H., Kohtoku, M., Takada, K., Okamoto, K.: Measurement of phase and amplitude error distributions in arrayed-waveguide grating multi/demultiplexers based on dispersive waveguide. J. Lightwave Technol. 18, 1309–1320 (2000)ADSCrossRef
Metadaten
Titel
Measurement of phases and amplitudes of AWG by fitting interference intensities
verfasst von
Sungwoo Lim
Yong Ho Oh
Chun Soo Go
Publikationsdatum
01.05.2013
Verlag
Springer US
Erschienen in
Optical and Quantum Electronics / Ausgabe 5/2013
Print ISSN: 0306-8919
Elektronische ISSN: 1572-817X
DOI
https://doi.org/10.1007/s11082-013-9660-x

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