Skip to main content
Erschienen in: Journal of Electronic Materials 6/2021

25.03.2021 | Original Research Article

Morphological and Optical Studies of ZnO-Silica Nanocomposite Thin Films Synthesized by Time Dependent CBD

verfasst von: Sunil Kumar, Rajni Seth, Sanjay Panwar, Kapil Kumar Goyal, Vijay Kumar, Ravi Kant Choubey

Erschienen in: Journal of Electronic Materials | Ausgabe 6/2021

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

ZnO-SiO2 nanocomposite thin films were synthesized using a facile and cost-effective chemical bath deposition for different growth durations, under alkaline conditions on microscopic glass slides. Effect of deposition time on the morphological and optical properties were thoroughly investigated using x-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive x-ray analysis (EDX), transmittance and time-resolved photoluminescence studies, etc. XRD patterns confirmed the formation of ZnO and diffused ZnO-Silica phases of hetero-structures at a particular growth time starting from the amorphous silica phase. SEM micrographs revealed an appreciable change in morphology of the particles with increasing growth time. Uniform porous films with improved surface coverage resulted on the substrate after an incubation period of 2 h. The EDX spectra confirmed that the thin films composed of ZnO and silica co-exist without any other impurities. It was observed that transmittance of the films decreased with increase in growth duration, whereas a slight variation in band gap was observed. The observed diminutive red shift in the band gap is due to a slight change in the transmission cut off edge. Laser-induced, time-resolved photoluminescence studies were conducted using pulse excitation in the nano-sec time domain. It showed an appreciable decrease in deep defect level emission at higher deposition duration, which arose due to unintentional doping in ZnO, creating a large number of native defects.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literatur
1.
Zurück zum Zitat F. Xu, Y. Shen, L. Sun, H. Zeng, and Y. Lu, Nanoscale 3, 5020 (2011).CrossRef F. Xu, Y. Shen, L. Sun, H. Zeng, and Y. Lu, Nanoscale 3, 5020 (2011).CrossRef
2.
3.
Zurück zum Zitat T.W. Hamann, A.B.F. Martinson, J.W. Elam, M.J. Pellin, and J.T. Hupp, Adv. Mater. 20, 1560 (2008).CrossRef T.W. Hamann, A.B.F. Martinson, J.W. Elam, M.J. Pellin, and J.T. Hupp, Adv. Mater. 20, 1560 (2008).CrossRef
4.
Zurück zum Zitat H. Meruvu, M. Vangalapati, S.C. Chippada, and S.R. Bammidi, Rasayan J. Chem. 4, 217 (2011). H. Meruvu, M. Vangalapati, S.C. Chippada, and S.R. Bammidi, Rasayan J. Chem. 4, 217 (2011).
5.
Zurück zum Zitat N. Jones, B. Ray, K.T. Ranjit, and A.C. Manna, FEMS Microbiol Lett. 279, 71 (2008).CrossRef N. Jones, B. Ray, K.T. Ranjit, and A.C. Manna, FEMS Microbiol Lett. 279, 71 (2008).CrossRef
6.
Zurück zum Zitat X. Liu, X. Wu, H. Cao, and R.P.H. Chang, J. Appl. Phys. 95, 3141 (2004).CrossRef X. Liu, X. Wu, H. Cao, and R.P.H. Chang, J. Appl. Phys. 95, 3141 (2004).CrossRef
7.
Zurück zum Zitat O. Lupan, L. Chow, G. Chai, L. Chernyak, O.L. Tirpak, and H. Heinrich, Phys. Status Solidi A 205, 2673 (2008).CrossRef O. Lupan, L. Chow, G. Chai, L. Chernyak, O.L. Tirpak, and H. Heinrich, Phys. Status Solidi A 205, 2673 (2008).CrossRef
9.
Zurück zum Zitat X. Guo, Q. Zhao, R. Li, H. Pan, G. Guo, A. Yin, and W. Dai, Opt. Exp. 18, 18401 (2010).CrossRef X. Guo, Q. Zhao, R. Li, H. Pan, G. Guo, A. Yin, and W. Dai, Opt. Exp. 18, 18401 (2010).CrossRef
10.
Zurück zum Zitat S.H. Jo, D. Banerjee, and Z.F. Ren, Appl. Phys. Lett. 85, 1407 (2004).CrossRef S.H. Jo, D. Banerjee, and Z.F. Ren, Appl. Phys. Lett. 85, 1407 (2004).CrossRef
11.
Zurück zum Zitat Y.L. Wu, A.I.Y. Tok, F.Y.C. Boey, X.T. Zeng, and X.H. Zhang, Appl. Surf. Sci. 253, 5473 (2007).CrossRef Y.L. Wu, A.I.Y. Tok, F.Y.C. Boey, X.T. Zeng, and X.H. Zhang, Appl. Surf. Sci. 253, 5473 (2007).CrossRef
12.
13.
14.
15.
Zurück zum Zitat C.C. Lin, H.P. Chen, and S.Y. Chen, Phys. Lett. 404, 30 (2005). C.C. Lin, H.P. Chen, and S.Y. Chen, Phys. Lett. 404, 30 (2005).
16.
Zurück zum Zitat A. Kumar, S. Mukherjee, S. Sahare, and R.K. Choubey Mater. Sci. Semicond. Process. 122, 105471 (2021).CrossRef A. Kumar, S. Mukherjee, S. Sahare, and R.K. Choubey Mater. Sci. Semicond. Process. 122, 105471 (2021).CrossRef
17.
Zurück zum Zitat S. Kumar, H.C. Jeon, T.W. Kang, R. Seth, S. Panwar, S.K. Shinde, D.P. Waghmode, R.G. Saratale, and R.K. Choubey, J. Mater. Sci. Mater. Electron. 30, 17747 (2019).CrossRef S. Kumar, H.C. Jeon, T.W. Kang, R. Seth, S. Panwar, S.K. Shinde, D.P. Waghmode, R.G. Saratale, and R.K. Choubey, J. Mater. Sci. Mater. Electron. 30, 17747 (2019).CrossRef
18.
Zurück zum Zitat A. Kumar, D. Pednekar, S. Mukherjee, and R.K. Choubey, J. Mater. Sci. Mater. Electron. 31, 17055 (2020).CrossRef A. Kumar, D. Pednekar, S. Mukherjee, and R.K. Choubey, J. Mater. Sci. Mater. Electron. 31, 17055 (2020).CrossRef
19.
Zurück zum Zitat R.K. Choubey, D. Desai, S.N. Kale, and S. Kumar, J. Mater. Sci. Mater. Electron. 27, 7890 (2016).CrossRef R.K. Choubey, D. Desai, S.N. Kale, and S. Kumar, J. Mater. Sci. Mater. Electron. 27, 7890 (2016).CrossRef
20.
Zurück zum Zitat R.K. Choubey, S. Kumar, and C.W. Lan, Adv. Nat. Sci. Nanosci. Nanotechnol. 5, 025015 (2014).CrossRef R.K. Choubey, S. Kumar, and C.W. Lan, Adv. Nat. Sci. Nanosci. Nanotechnol. 5, 025015 (2014).CrossRef
21.
Zurück zum Zitat D. Vernardou, G. Kenanakis, S. Couris, E. Koudoumas, E. Kymakis, and N. Katsarakis, Thin Solid Films 515, 8764 (2007).CrossRef D. Vernardou, G. Kenanakis, S. Couris, E. Koudoumas, E. Kymakis, and N. Katsarakis, Thin Solid Films 515, 8764 (2007).CrossRef
22.
Zurück zum Zitat D. Polsongkram, P. Chamninok, S. Pukird, L. Chow, O. Lupan, G. Chai, H. Khallaf, S. Park, and A. Schulte, Phys. B 403, 3713 (2008).CrossRef D. Polsongkram, P. Chamninok, S. Pukird, L. Chow, O. Lupan, G. Chai, H. Khallaf, S. Park, and A. Schulte, Phys. B 403, 3713 (2008).CrossRef
23.
Zurück zum Zitat L. Miao, S. Tanemura, M. Tanemura, S.P. Lau, and B.K. Tay, J Mater Sci: Mater Electron. 18, S343 (2007). L. Miao, S. Tanemura, M. Tanemura, S.P. Lau, and B.K. Tay, J Mater Sci: Mater Electron. 18, S343 (2007).
24.
Zurück zum Zitat A.B. Djurisic, Y.H. Leung, K.H. Tam, Y.F. Hsu, L. Ding, W.K. Ge, Y.C. Zhong, K.S. Wong, W.K. Chan, H.L. Tam, K.W. Cheah, W.M. Kwok, and D.L. Phillips, Nanotechnology 18, 095702 (2007).CrossRef A.B. Djurisic, Y.H. Leung, K.H. Tam, Y.F. Hsu, L. Ding, W.K. Ge, Y.C. Zhong, K.S. Wong, W.K. Chan, H.L. Tam, K.W. Cheah, W.M. Kwok, and D.L. Phillips, Nanotechnology 18, 095702 (2007).CrossRef
25.
Zurück zum Zitat T. Tani, L. Madler, and S.E. Pratsinis, J. Mater. Sci. 37, 4627 (2002).CrossRef T. Tani, L. Madler, and S.E. Pratsinis, J. Mater. Sci. 37, 4627 (2002).CrossRef
26.
Zurück zum Zitat C.K. Kasar, J.P. Bange, and D.S. Patil, J. Mater. Sci. Mater. Electron. 28, 11217 (2017).CrossRef C.K. Kasar, J.P. Bange, and D.S. Patil, J. Mater. Sci. Mater. Electron. 28, 11217 (2017).CrossRef
27.
Zurück zum Zitat L.M. Mahajan, C.K. Kasar, and D.S. Patil, Mater. Res. Express 6, 045053 (2019).CrossRef L.M. Mahajan, C.K. Kasar, and D.S. Patil, Mater. Res. Express 6, 045053 (2019).CrossRef
28.
Zurück zum Zitat B.K. Sonawane, M.P. Bhole, and D.S. Patil, Mater. Sci. Semicond. Process. 12, 212 (2009).CrossRef B.K. Sonawane, M.P. Bhole, and D.S. Patil, Mater. Sci. Semicond. Process. 12, 212 (2009).CrossRef
29.
30.
Zurück zum Zitat B.N. Sherikar, B. Sahoo, and A.M. Umarji, Solid State Sci. 109, 106426 (2020).CrossRef B.N. Sherikar, B. Sahoo, and A.M. Umarji, Solid State Sci. 109, 106426 (2020).CrossRef
31.
Zurück zum Zitat A. Kumar, R. Kumar, N. Verma, A.V. Anupama, H.K. Choudhary, R. Philip, and B. Sahoo, Opt. Mater. 108, 110163 (2020).CrossRef A. Kumar, R. Kumar, N. Verma, A.V. Anupama, H.K. Choudhary, R. Philip, and B. Sahoo, Opt. Mater. 108, 110163 (2020).CrossRef
32.
Zurück zum Zitat R. Kumar, A. Kumar, N. Verma, R. Philip, and B. Sahoo, J. Alloys Compd. 849, 156665 (2020).CrossRef R. Kumar, A. Kumar, N. Verma, R. Philip, and B. Sahoo, J. Alloys Compd. 849, 156665 (2020).CrossRef
33.
Zurück zum Zitat R. Kumar, A. Kumar, N. Verma, A.V. Anupama, R. Philip, and B. Sahoo, Carbon 153, 545 (2019).CrossRef R. Kumar, A. Kumar, N. Verma, A.V. Anupama, R. Philip, and B. Sahoo, Carbon 153, 545 (2019).CrossRef
34.
Zurück zum Zitat R. Kumar, A. Kumar, N. Verma, V. Khopkar, R. Philip, and B. Sahoo, ACS Applied Nano Materials 3, 8618 (2020).CrossRef R. Kumar, A. Kumar, N. Verma, V. Khopkar, R. Philip, and B. Sahoo, ACS Applied Nano Materials 3, 8618 (2020).CrossRef
35.
Zurück zum Zitat B.K. Das, T. Das, K. Parashar, S.K.S. Parashar, R. Kumar, H.K. Choudhary, V.B. Khopkar, A.V. Anupama, and B. Sahoo, Mater. Chem. Phys. 221, 419 (2019).CrossRef B.K. Das, T. Das, K. Parashar, S.K.S. Parashar, R. Kumar, H.K. Choudhary, V.B. Khopkar, A.V. Anupama, and B. Sahoo, Mater. Chem. Phys. 221, 419 (2019).CrossRef
36.
Zurück zum Zitat T. Das, B.K. Das, K. Parashar, R. Kumar, H.K. Choudhary, A.V. Anupama, B. Sahoo, P.K. Sahoo, and S.K.S. Parashar, J. Mater. Sci. Mater. Electron. 28, 13587 (2017).CrossRef T. Das, B.K. Das, K. Parashar, R. Kumar, H.K. Choudhary, A.V. Anupama, B. Sahoo, P.K. Sahoo, and S.K.S. Parashar, J. Mater. Sci. Mater. Electron. 28, 13587 (2017).CrossRef
37.
Zurück zum Zitat B.K. Das, T. Das, K. Parashar, S.K.S. Parashar, R. Kumar, A.V. Anupama, and B. Sahoo, Electron. Mater. Lett. 16, 255 (2020).CrossRef B.K. Das, T. Das, K. Parashar, S.K.S. Parashar, R. Kumar, A.V. Anupama, and B. Sahoo, Electron. Mater. Lett. 16, 255 (2020).CrossRef
38.
Zurück zum Zitat L.N. Mahour, H.K. Choudhary, R. Kumar, A.V. Anupama, and B. Sahoo, Ceram. Int. 45, 24625 (2019).CrossRef L.N. Mahour, H.K. Choudhary, R. Kumar, A.V. Anupama, and B. Sahoo, Ceram. Int. 45, 24625 (2019).CrossRef
39.
Zurück zum Zitat N. Srinatha, P. Raghu, H.M. Mahesh, and B. Angadi, J. Alloys Compd. 722, 888 (2017).CrossRef N. Srinatha, P. Raghu, H.M. Mahesh, and B. Angadi, J. Alloys Compd. 722, 888 (2017).CrossRef
40.
Zurück zum Zitat D. Byrne, E. McGlynn, J. Cullen, and M.O. Henry, Nanoscale 3, 1675 (2011).CrossRef D. Byrne, E. McGlynn, J. Cullen, and M.O. Henry, Nanoscale 3, 1675 (2011).CrossRef
42.
Zurück zum Zitat T.A. Vijayan, R. Chandramohan, S. Valanarasu, J. Thirumalai, S. Venkateswaran, T. Mahalingam, and S.R. Srikumar, Sci. Technol. Adv. Mater. 9, 035007 (2008).CrossRef T.A. Vijayan, R. Chandramohan, S. Valanarasu, J. Thirumalai, S. Venkateswaran, T. Mahalingam, and S.R. Srikumar, Sci. Technol. Adv. Mater. 9, 035007 (2008).CrossRef
43.
Zurück zum Zitat S. Sharma, C. Periasamy, and P. Chakrabarti, Electron. Mater. Lett. 11, 1093 (2015).CrossRef S. Sharma, C. Periasamy, and P. Chakrabarti, Electron. Mater. Lett. 11, 1093 (2015).CrossRef
44.
Zurück zum Zitat P.B. Taunk, R. Das, D.P. Bisen, R.K. Tamrakar, and N. Rathor, Karbala Int. J. Mod. Sci. 1, 159 (2015).CrossRef P.B. Taunk, R. Das, D.P. Bisen, R.K. Tamrakar, and N. Rathor, Karbala Int. J. Mod. Sci. 1, 159 (2015).CrossRef
45.
Zurück zum Zitat S. Chakrabarti, D. Ganguli, and S. Chaudhuri, Phys. Status Solidi A 201, 2134 (2004).CrossRef S. Chakrabarti, D. Ganguli, and S. Chaudhuri, Phys. Status Solidi A 201, 2134 (2004).CrossRef
46.
Zurück zum Zitat M. Mazur, D. Kaczmarek, J. Domaradzki, D. Wojcieszak, S. Song, F. Placido, 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), pp. 65–68 (2010). M. Mazur, D. Kaczmarek, J. Domaradzki, D. Wojcieszak, S. Song, F. Placido, 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), pp. 65–68 (2010).
Metadaten
Titel
Morphological and Optical Studies of ZnO-Silica Nanocomposite Thin Films Synthesized by Time Dependent CBD
verfasst von
Sunil Kumar
Rajni Seth
Sanjay Panwar
Kapil Kumar Goyal
Vijay Kumar
Ravi Kant Choubey
Publikationsdatum
25.03.2021
Verlag
Springer US
Erschienen in
Journal of Electronic Materials / Ausgabe 6/2021
Print ISSN: 0361-5235
Elektronische ISSN: 1543-186X
DOI
https://doi.org/10.1007/s11664-021-08863-2

Weitere Artikel der Ausgabe 6/2021

Journal of Electronic Materials 6/2021 Zur Ausgabe

Neuer Inhalt