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2014 | OriginalPaper | Buchkapitel

8. Other Surface Imaging Methods with Electrons

verfasst von : Ernst Bauer

Erschienen in: Surface Microscopy with Low Energy Electrons

Verlag: Springer New York

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Abstract

There are many other surface imaging methods, which are competing or complementary to cathode lens microscopy with slow electrons. Scanning probe microscopy in various imaging modes extends the resolution down to the atomic level and is frequently combined with the imaging methods discussed in this book. Here we make only a short comparison with imaging methods using reflected or emitted electrons, independent of energy and experimental setup.

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Titel: Other Surface Imaging Methods with Electrons
verfasst von: Ernst Bauer
Verlag: Springer New York
Buch: Surface Microscopy with Low Energy Electrons
Print ISBN: 978-1-4939-0934-6

Electronic ISBN: 978-1-4939-0935-3

Copyright-Jahr: 2014
DOI: https://doi.org/10.1007/978-1-4939-0935-3_8

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