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Erschienen in: Journal of Materials Science 21/2016

20.07.2016 | Original Paper

Post annealing temperature-dependent morphological and electrochemical properties of copper hydroxide thin film electrodes obtained by anodization of copper

verfasst von: T. S. Ghadge, B. J. Lokhande

Erschienen in: Journal of Materials Science | Ausgabe 21/2016

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Abstract

Anodization of copper substrates was made in 1 M aqueous sodium hydroxide solution to prepare copper hydroxide thin films. The prepared samples (at 0.9 V) were annealed in air for 1 h by varying the annealing temperature from 523 to 673 K. XRD study confirms the orthorhombic crystal structure for copper hydroxide, whereas cubic to monoclinic crystal structure transformation was observed for copper oxide with increasing annealing temperature. The increase in granular size of copper oxide with temperature was clearly endorsed from morphological study. Electrochemical study reveals the pseudocapacitive behavior for the sample annealed at 598 K with optimum-specific capacitance of 6000 F/g at the scan rate 2 mV/s in 1 M NaOH. The Specific energy, Specific power, and Columbic efficiency (η) were calculated by using chronopotentiometric technique. Electrochemical impedance spectroscopy carried out in the frequency range of 1 mHz–1 MHz gives internal resistance which is about 1.75 Ω/cm2. The Randles equivalent circuit and its circuitry parameters are reported.

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Metadaten
Titel
Post annealing temperature-dependent morphological and electrochemical properties of copper hydroxide thin film electrodes obtained by anodization of copper
verfasst von
T. S. Ghadge
B. J. Lokhande
Publikationsdatum
20.07.2016
Verlag
Springer US
Erschienen in
Journal of Materials Science / Ausgabe 21/2016
Print ISSN: 0022-2461
Elektronische ISSN: 1573-4803
DOI
https://doi.org/10.1007/s10853-016-0221-0

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