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Erschienen in:
1981 | OriginalPaper | Buchkapitel
Practical Techniques of X-Ray Analysis
verfasst von : Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
Erschienen in: Scanning Electron Microscopy and X-Ray Microanalysis
Verlag: Springer US
Enthalten in: Professional Book Archive
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It has already been shown in Chapter 6 that qualitative analysis is based on the ability of a spectrometer system to measure characteristic line energies and relate those energies to the presence of specific elements. This process is relatively straightforward if (1) the spectrometer system is properly calibrated, (2) the operating conditions are adequate to give sufficient x-ray counts so that a given peak can be easily distinguished from the corresponding background level, and (3) no serious peak overlaps are present.