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1995 | OriginalPaper | Buchkapitel

Reflection Difference Techniques

verfasst von : Dietrich Zahn

Erschienen in: Epioptics

Verlag: Springer Berlin Heidelberg

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Reflectance measurements are conventionally used to derive the optical constants of solid materials, i.e. the refractive index, N, and the extinction coefficient, K. At near normal incidence, for example, the reflectance, R, (the ratio of the reflected to incident EM intensity: see Sect. 1.3) is given by: (4.1)$$R = \frac{{{{(n - 1)}^2} + {\kappa ^2}}}{{{{(n + 1)}^2} + {\kappa ^2}}}$$ The optical constants are related to the dielectric function, ε = ε’ + iε” by: (4.2)$$\varepsilon ' = {n^2} - {\kappa ^2}{\text{ and }}\varepsilon '' = 2n\kappa $$

Metadaten
Titel
Reflection Difference Techniques
verfasst von
Dietrich Zahn
Copyright-Jahr
1995
Verlag
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-642-79820-7_4