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Erschienen in:
Introduction to Nanotechnology Kapitel lesen Erstes Kapitel lesen

2017 | OriginalPaper | Buchkapitel

23. Scanning Probe Microscopy — Principle of Operation, Instrumentation and Probes

verfasst von : Bharat Bhushan, Othmar Marti

Erschienen in: Springer Handbook of Nanotechnology

Verlag: Springer Berlin Heidelberg

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Abstract

Since the introduction of the Scanning Tunneling Microscope (STM) in 1981 and Atomic Force Microscope (AFM) in 1985, many variations of probe-based microscopies, referred to as Scanning Probe Microscopes (SPM), have been developed. While the pure imaging capabilities of SPM techniques are dominated by the application of these methods at their early development stages, the physics of probe-sample interactions and the quantitative analyses of tribological, electronic, magnetic, biological, and chemical surfaces have now become of increasing interest. In this chapter, we introduce various STM and AFM designs, various operating modes, various probes (tips), and AFM instrumentation and analyses.

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Vorheriges Kapitel Biological Molecules in Therapeutic Nanodevices
Nächstes Kapitel Low-Temperature Scanning Probe Microscopy
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Metadaten
Titel
Scanning Probe Microscopy — Principle of Operation, Instrumentation and Probes
verfasst von
Bharat Bhushan
Othmar Marti
Copyright-Jahr
2017
Verlag
Springer Berlin Heidelberg
Buch
Springer Handbook of Nanotechnology

Print ISBN: 978-3-662-54355-9

Electronic ISBN: 978-3-662-54357-3

Copyright-Jahr: 2017

DOI
https://doi.org/10.1007/978-3-662-54357-3_23

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