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1984 | OriginalPaper | Buchkapitel

SIMS with Very High Spatial Resolution Using Liquid Metal Ion Sources

verfasst von : A. R. Waugh, A. R. Bayly, K. Anderson

Erschienen in: Secondary Ion Mass Spectrometry SIMS IV

Verlag: Springer Berlin Heidelberg

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The practical lateral spatial resolution of scanned ion microprobes has been limited until recently to ≳ 1μm by the relatively low brightness and large source size of duoplasmatron ion sources [1]. During the last decade liquid metal field-ion sources (LMFIS) have been developed with much higher brightness (~106 A/cm2.sr) and small source size (<100nm) [2,3] : it was recognised early on that these sources were potentially very suitable for ion probes with sub-micron resolution [1, 31. SELIGER and coworkers [4] showed that probe diameters of less than 100nm at 55keV were possible using gallium ion.

Metadaten
Titel
SIMS with Very High Spatial Resolution Using Liquid Metal Ion Sources
verfasst von
A. R. Waugh
A. R. Bayly
K. Anderson
Copyright-Jahr
1984
Verlag
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-642-82256-8_39

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