Skip to main content

2016 | OriginalPaper | Buchkapitel

Simulation of Electrical Characteristics of Silicon and Germanium Nanowires Progressively Doped to Zener Diode Configuration Using First Principle Calculations

verfasst von : Mayank Chakraverty, P. S. Harisankar, Kinshuk Gupta, Vaibhav Ruparelia, Hisham Rahman

Erschienen in: Microelectronics, Electromagnetics and Telecommunications

Verlag: Springer India

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

The effect of incorporating pairs of dopant atoms of opposite polarities into the nanowire lattice on the electrical behavior of nanowires has been presented in this paper. The dopants used are boron and phosphorus atoms. Intrinsic silicon nanowire is incapacitated with boron-phosphorus dopant atom pairs in a progressive manner, starting from one pair to nine dopant-atom pairs. The nanowire is simulated each time an additional dopant pair is introduced in the nanowire lattice to obtain current-voltage characteristics. These characteristics have been compared with that obtained by introducing similar dopants in an intrinsic germanium nanowire lattice. The power efficiencies of both intrinsic and doped silicon and germanium nanowires have been discussed towards the end of the paper.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literatur
1.
Zurück zum Zitat J. Wang, Device physics and simulation of silicon NW transistors. PhD Thesis, Univ. Purdue, August 2005 J. Wang, Device physics and simulation of silicon NW transistors. PhD Thesis, Univ. Purdue, August 2005
2.
Zurück zum Zitat E. Sangiorgi, A. Asenov, H.S. Bennett, R.W. Dutton, D. Esseni, M.D. Giles, M. Hane, C. Jungemann, K. Nishi, S. Selberherr, S. Takagi, Special issue on simulation and modeling of nanoelectronics devices. IEEE Trans. Electron Devices 54(9), 2072–2078 E. Sangiorgi, A. Asenov, H.S. Bennett, R.W. Dutton, D. Esseni, M.D. Giles, M. Hane, C. Jungemann, K. Nishi, S. Selberherr, S. Takagi, Special issue on simulation and modeling of nanoelectronics devices. IEEE Trans. Electron Devices 54(9), 2072–2078
3.
Zurück zum Zitat Wang, Theoretical investigation of surface roughness scattering in silicon nanowire transistors. Appl. Phys. Lett. 87, 043101 (2005) Wang, Theoretical investigation of surface roughness scattering in silicon nanowire transistors. Appl. Phys. Lett. 87, 043101 (2005)
4.
Zurück zum Zitat C. Enz, E.A. Vittoz, Charge-based MOS transistor modeling. The EKV model for low power and RF IC design. Wiley (2006) C. Enz, E.A. Vittoz, Charge-based MOS transistor modeling. The EKV model for low power and RF IC design. Wiley (2006)
5.
Zurück zum Zitat A.K. Sharma, S.H. Zaidi, S. Lucero, S.R.J. Brueck, N.E. Islam, Mobility and transverse electric field effects in channel conduction of wrap-around-gate NW MOSFETs. In: IEE Proceedings-Circuits Devices System, vol. 151, no. 5, pp. 422–430, October 2004 A.K. Sharma, S.H. Zaidi, S. Lucero, S.R.J. Brueck, N.E. Islam, Mobility and transverse electric field effects in channel conduction of wrap-around-gate NW MOSFETs. In: IEE Proceedings-Circuits Devices System, vol. 151, no. 5, pp. 422–430, October 2004
6.
Zurück zum Zitat A. Chaudhry, J.N. Roy, MOSFET models, quantum mechanical effects and modeling approaches: a review. Semiconductor Technol. Sci. 10(1), 20–27 (2010)CrossRef A. Chaudhry, J.N. Roy, MOSFET models, quantum mechanical effects and modeling approaches: a review. Semiconductor Technol. Sci. 10(1), 20–27 (2010)CrossRef
7.
Zurück zum Zitat Y.S. Yu1, N. Cho, J.H. Oh, S.W. Hwang, D. Ahn, Explicit continuous current–voltage (I–V) models for fully-depleted surrounding-gate MOSFETs (SGMOSFETs) with a finite doping body. J. Nanosci. Nanotechnol. 10(5), 3316–3320 (2010) Y.S. Yu1, N. Cho, J.H. Oh, S.W. Hwang, D. Ahn, Explicit continuous current–voltage (I–V) models for fully-depleted surrounding-gate MOSFETs (SGMOSFETs) with a finite doping body. J. Nanosci. Nanotechnol. 10(5), 3316–3320 (2010)
8.
Zurück zum Zitat C.A. Richter, H.D. Xiong, X. Zhu, W. Wang, V.M. Stanford, W.-Ki Hong, T. Lee, D.E. Ioannou, Q. Li, Metrology for the electrical characterization of semiconductor NWs. IEEE Trans. Electron Devices 55(11), 3086–3095 (2008)CrossRef C.A. Richter, H.D. Xiong, X. Zhu, W. Wang, V.M. Stanford, W.-Ki Hong, T. Lee, D.E. Ioannou, Q. Li, Metrology for the electrical characterization of semiconductor NWs. IEEE Trans. Electron Devices 55(11), 3086–3095 (2008)CrossRef
9.
Zurück zum Zitat B. Iñiguez, T.A. Fjeldly, A. Lázaro, F. Danneville, M.J. Deen, Compact-modeling solutions for nanoscale double-gate and gate-all-around MOSFETs. IEEE Trans. Electron Devices 53(9), 2128–2142 (2006) B. Iñiguez, T.A. Fjeldly, A. Lázaro, F. Danneville, M.J. Deen, Compact-modeling solutions for nanoscale double-gate and gate-all-around MOSFETs. IEEE Trans. Electron Devices 53(9), 2128–2142 (2006)
10.
Zurück zum Zitat C. Mayank, G. Kinshuk, V.G. Babu et al., A technological review on quantum ballistic transport model based silicon nanowire field effect transistors for circuit simulation and design. J. Nanosci. Nanoeng. Appl. 5(2), 20–31p (2015) C. Mayank, G. Kinshuk, V.G. Babu et al., A technological review on quantum ballistic transport model based silicon nanowire field effect transistors for circuit simulation and design. J. Nanosci. Nanoeng. Appl. 5(2), 20–31p (2015)
Metadaten
Titel
Simulation of Electrical Characteristics of Silicon and Germanium Nanowires Progressively Doped to Zener Diode Configuration Using First Principle Calculations
verfasst von
Mayank Chakraverty
P. S. Harisankar
Kinshuk Gupta
Vaibhav Ruparelia
Hisham Rahman
Copyright-Jahr
2016
Verlag
Springer India
DOI
https://doi.org/10.1007/978-81-322-2728-1_38

Neuer Inhalt