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Journal of Sol-Gel Science and Technology

Erschienen in:

01.04.2014 | Original Paper

Single oscillator model and refractive index dispersion properties of ternary ZnO films by sol gel method

verfasst von: R. H. Al Orainy

Erschienen in: Journal of Sol-Gel Science and Technology | Ausgabe 1/2014

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Abstract

The optical constants of the NiMnZnO thin films prepared by spin-coating method were determined using transmittance and reflectance spectra. The optical band gap of the NiMnZnO thin films was found to be in the range of 3.20–3.35 eV. The refractive index dispersion of the NiMnZnO films obeys the single oscillator model. The dispersion energy and oscillator energy values of the NiMnZnO films were found to be in the range of 6.46–9.85 and 4.82–5.54 eV, respectively. The real and imaginary parts of the dielectric constants of the NiMnZnO films were determined. The reflectance spectra of the NiMnZnO films give a peak and the presence of this peak is due to the photoexcitation process, in which, the electrons are excited from valence band to the conduction band. The obtained results suggest that the optical constants and refractive dispersion energy parameters of the films are controlled by the molar ratios of NiMnZnO films.

Vorheriger Artikel Facile preparation of vanadium oxide thin films on sapphire(0001) by sol–gel method

Nächster Artikel Fabrication of hierarchically porous silica nanospheres through sol–gel process and pseudomorphic transformation

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Titel: Single oscillator model and refractive index dispersion properties of ternary ZnO films by sol gel method
verfasst von: R. H. Al Orainy
Publikationsdatum: 01.04.2014
Verlag: Springer US
Erschienen in: Journal of Sol-Gel Science and Technology / Ausgabe 1/2014
Print ISSN: 0928-0707
Elektronische ISSN: 1573-4846
DOI: https://doi.org/10.1007/s10971-014-3272-1

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