Ausgabe 3/2005
Inhalt (7 Artikel)
A nondestructive automated defect detection system for silicon carbide wafers
Toshiro Kubota, Parag Talekar, Xianyun Ma, Tangali S. Sudarshan
Texture analysis based on local analysis of the Bidimensional Empirical Mode Decomposition
J. C. Nunes, S. Guyot, E. Deléchelle
Shape analysis of concrete aggregates for statistical quality modeling
Ilkka Kalliomäki, Aki Vehtari, Jouko Lampinen