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Machine Vision and Applications

Ausgabe 3/2005

Inhalt (7 Artikel)

Computing depth maps from descent images

Yalin Xiong, Clark F. Olson, Larry H. Matthies

A nondestructive automated defect detection system for silicon carbide wafers

Toshiro Kubota, Parag Talekar, Xianyun Ma, Tangali S. Sudarshan

Shape analysis of concrete aggregates for statistical quality modeling

Ilkka Kalliomäki, Aki Vehtari, Jouko Lampinen