2014 | OriginalPaper | Buchkapitel
Dc conductivity and High Field Behavior of Se100-xTex Alloy
verfasst von : Mohsin Ganaie, Shabir Kumar, Adam A. Bahishti, M. Zulfequar
Erschienen in: Physics of Semiconductor Devices
Verlag: Springer International Publishing
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
Zinc oxide (ZnO) thin films were deposited by sol–gel spin coating method on the glass substrate and then the film was annealed at 350, 450, 550 C for 1 h. Effect of annealing temperature on the structural and optical properties of the film was investigated. Annealed ZnO thin films are polycrystalline with (002) preferential orientation. The information on Crystalline size is obtained from the full width-at half- maximum (FWHM) of the diffraction peaks. The surface morphology of the films was investigated by atomic force microscopy (AFM). Surface roughness was found minimum (8.4 nm) for ZnO sample annealed at 450 C. The maximum transmittance of 87 % is observed for the film annealed at 450 C. The optical band gap value decreased and crystalline size increased with increasing the annealing temperatures.