Skip to main content

1998 | OriginalPaper | Buchkapitel

Technological Aspects of TQM

verfasst von : C. Hirotsu

Erschienen in: Quality Improvement Through Statistical Methods

Verlag: Birkhäuser Boston

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

A Beyond Analysis of Variance technique is introduced as an off-line technology for Total Quality Management. It takes into account the characteristics of factors involved in an experiment for a more satisfactory analysis of data. It also efficiently utilizes the intrinsic natural ordering appearing frequently in relation to time, temperature, dose and so on.

Metadaten
Titel
Technological Aspects of TQM
verfasst von
C. Hirotsu
Copyright-Jahr
1998
Verlag
Birkhäuser Boston
DOI
https://doi.org/10.1007/978-1-4612-1776-3_22