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2018 | OriginalPaper | Buchkapitel

Ultralow Power 8T Subthreshold SRAM Cell

verfasst von : Devarapalli Mounika, Akondi Narayana Kiran

Erschienen in: Microelectronics, Electromagnetics and Telecommunications

Verlag: Springer Singapore

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Abstract

Static Random Access Memory (SRAM) is an important component in these systems therefore ultralow power SRAM has become popular. An Eight-transistor (8T) SRAM cell achieved high data stability in subthreshold operation. The single ended with dynamic feedback control 8T SRAM Cell was implemented with less power consumption verified at all process corners. The standard deviation and mean calculations performed for static noise margins by using Monte Carlo simulation at 300 mV in cadence 45 nm technology.

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Literatur
1.
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2.
Zurück zum Zitat J.P. Kulkarni, K. Kim, and K. Roy, A 160 mV robust Schmitt trigger based subthreshold SRAM, IEEE J. Solid-State Circuits, vol. 42, no. 10, pp. 2303–2313, Oct. 2007. J.P. Kulkarni, K. Kim, and K. Roy, A 160 mV robust Schmitt trigger based subthreshold SRAM, IEEE J. Solid-State Circuits, vol. 42, no. 10, pp. 2303–2313, Oct. 2007.
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Zurück zum Zitat C.B. Kushwah, S.K Vishvakarma, A Sub-threshold eight transistor (8T) SRAM cell design for stability improvement, in proc. IEEE Int. Conf. IC Design Technol. (ICICDT), May 2014. C.B. Kushwah, S.K Vishvakarma, A Sub-threshold eight transistor (8T) SRAM cell design for stability improvement, in proc. IEEE Int. Conf. IC Design Technol. (ICICDT), May 2014.
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Zurück zum Zitat M.-F. Chang, S-W. Chang, P-W. Chou, and W.-C Wu, A 130 mV SRAM with expanded write and read margins for subthreshold applications, IEEE J. Solid State Circuits, vol-46, no. 2, pp. 520–529, Feb. 2011. M.-F. Chang, S-W. Chang, P-W. Chou, and W.-C Wu, A 130 mV SRAM with expanded write and read margins for subthreshold applications, IEEE J. Solid State Circuits, vol-46, no. 2, pp. 520–529, Feb. 2011.
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Zurück zum Zitat B. Zhai, S. Hanson, D. Blaauw, and D. Sylvester, A Varient-tolerant sub-200 mV 6-T subthreshold SRAM, IEEE J. Solis State Circuits, Vol-43, no. 10, pp. 2338–2348, oct. 2008. B. Zhai, S. Hanson, D. Blaauw, and D. Sylvester, A Varient-tolerant sub-200 mV 6-T subthreshold SRAM, IEEE J. Solis State Circuits, Vol-43, no. 10, pp. 2338–2348, oct. 2008.
6.
Zurück zum Zitat J.P Kulakarni, K. Kim, and K. Roy A 160 mV robust Schmitt trigger based subthreshold SRAm, IEEE.J. Solid-State Circuits, vol. 42, no. 10, pp. 2303–2313, oct. 2007. J.P Kulakarni, K. Kim, and K. Roy A 160 mV robust Schmitt trigger based subthreshold SRAm, IEEE.J. Solid-State Circuits, vol. 42, no. 10, pp. 2303–2313, oct. 2007.
7.
Zurück zum Zitat B. Zhai, S. Hanson, D. Blaauw, and D. Sylvester, A variation-tolerant sub-200 mV 6-T subthreshold SRAM, IEEE J. Solid-State Circuits, vol. 43, no. 10, pp. 2338–2348, Oct. 2008. B. Zhai, S. Hanson, D. Blaauw, and D. Sylvester, A variation-tolerant sub-200 mV 6-T subthreshold SRAM, IEEE J. Solid-State Circuits, vol. 43, no. 10, pp. 2338–2348, Oct. 2008.
Metadaten
Titel
Ultralow Power 8T Subthreshold SRAM Cell
verfasst von
Devarapalli Mounika
Akondi Narayana Kiran
Copyright-Jahr
2018
Verlag
Springer Singapore
DOI
https://doi.org/10.1007/978-981-10-7329-8_70

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