2019 | OriginalPaper | Buchkapitel
Validation of Simulation Results on Coupled Problems
verfasst von : Rick Janssen, Renaud Gillon, Aarnout Wieers, Frederik Deleu, Hervé Guegnaud, Pascal Reynier, Wim Schoenmaker, E. Jan W. ter Maten
Erschienen in: Nanoelectronic Coupled Problems Solutions
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The Test Set for the Power-MOS Devices and RF-Circuitry, as described in Chapter [11], and the Measurements for RF-Amplifiers, Bond Wire Fusing and MOS Power Cells (see Chapter [18]) were used to validate simulation results of coupled problems by comparing with measurements, as well as by comparing to outcomes with other simulation tools (when possible, mostly without full coupling).