X-Ray Diffraction from the (3 × 3) Reconstructed B Surface of InSb

X-ray diffraction measurements have been perfgrmed with synchrotron radition under UHV conditions on the Sb rich ($$\bar 1\bar 1\bar 1$$) surface of InSb. This InSb. ($$\bar 1\bar 1\bar 1$$) B surface has a (3 × 3) reconstruction [49.1]. The surface was prepared by argon-ion bombardment and annealing at 400°C and was characterized using LEED and high-resolution photoemission. Using X-rays incident at the critical angle for total reflection (0.31°) we have measured the intensities of fractional-order Bragg rods corresponding to the (3 × 3) reconstruction on the B surface.