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Erschienen in:
1999 | OriginalPaper | Buchkapitel
Z-Contrast Scanning Transmission Electron Microscopy
verfasst von : S. J. Pennycook, P. D. Nellist
Erschienen in: Impact of Electron and Scanning Probe Microscopy on Materials Research
Verlag: Springer Netherlands
Enthalten in: Professional Book Archive
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Historically, the development of the transmission electron microscope has followed the path of continually increasing the degree of coherence of the imaging process. This is despite the fact that coherent high resolution images suffer from the phase problem which means they cannot be directly inverted to give the object. Interpretation must necessarily rely on simulation of images of trial objects. Even with the prospect of spherical aberration correction, coherent images will still take many forms depending on objective lens defocus and specimen thickness, and the inversion problem will remain.