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Pattern Analysis and Applications
Erschienen in: Pattern Analysis and Applications 1-2/2005

01.09.2005 | Theoretical Advances

Affine invariant fitting of algebraic curves using Fourier descriptors

verfasst von: Sait Sener, Mustafa Unel

Erschienen in: Pattern Analysis and Applications | Ausgabe 1-2/2005

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Abstract

Both parametric and implicit representations are used in a variety of computer vision applications such as object modeling, recognition and pose estimation. In this paper, we present a new algebraic curve fitting technique based on the implicitization of affine invariant Fourier descriptors that can be used to model free-form objects captured from different viewpoints. Implicitization can be carried out quite efficiently using a numerical procedure rather than computing determinants of eliminant matrices, symbolically. Affine invariance of the proposed fitting technique is experimentally shown on a database of 2D free-form objects. Experimental results are provided to assess the robustness of our fitting method under data perturbations. Some invariant recognition examples are also presented.
Vorheriger Artikel Audio-visual sports highlights extraction using Coupled Hidden Markov Models
Nächster Artikel Canonical representations of discrete curves

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Metadaten
Titel
Affine invariant fitting of algebraic curves using Fourier descriptors
verfasst von
Sait Sener
Mustafa Unel
Publikationsdatum
01.09.2005
Erschienen in
Pattern Analysis and Applications / Ausgabe 1-2/2005
Print ISSN: 1433-7541
Elektronische ISSN: 1433-755X
DOI
https://doi.org/10.1007/s10044-005-0245-6

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