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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 14/2020

12.06.2020

Aging characteristic of Cu-doped nickel manganite NTC ceramics

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 14/2020

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Abstract

The drift in electrical properties (e. g., the resistivity and B-value) is vital to the practical application for negative temperature coefficient (NTC) ceramics. In this work, Cu-doped nickel manganite ceramics were prepared by solid-state method, to investigate the degradation mechanism of both the resistivity and B-value. Results showed that the as-prepared ceramics exhibited typical NTC characteristics with cubic spinel phase, and that Cu doping greatly reduced the resistivity and B-value. However, the increase of Cu content in system aggravated the drift in the resistivity and B-value after the samples were aged at 300 °C for 30 h. XPS was carried out to further clarify the change in electrical properties. It was found that the decline of properties was due to the decrease of Mn4+ content in system after aging, which derived from the increase of chemical valence of Cu.
Vorheriger Artikel A reduced graphene oxide/bi-MOF-derived carbon composite as high-performance microwave absorber with tunable dielectric properties
Nächster Artikel Tunable negative permittivity of Bi2O3–SiO2/MWCNT glass-nanocomposites at radio frequency region

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Metadaten
Titel
Aging characteristic of Cu-doped nickel manganite NTC ceramics
Publikationsdatum
12.06.2020
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 14/2020
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-03730-y

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