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Erschienen in: Microsystem Technologies 8-9/2014

01.08.2014 | Technical Paper

An on-line optical bench tester machine for evaluating lens quality

verfasst von: Paul C.-P. Chao, Yung-Hua Kao, Wei-Hsuan Hsu, Yan-Pean Huang

Erschienen in: Microsystem Technologies | Ausgabe 8-9/2014

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Abstract

This study is dedicated to develop an on-line automatic optical bench tester (OBT) machine for evaluating the image quality of a camera lens that is used in a lens module of a cell phone. This tester is not only suitable for conventional solid lens, but also applicable to the developing cutting-edge tunable liquid crystal lens. The testing is accomplished via a specially-designed OBT machine, which is able to automatically move the test lens based on feedback images in the optical system in the OBT to the axial position that leads to best imaging quality and also successfully measure its focus length. In the designed OBT, a commercial inspection chart is employed, along with an automatic lens-feeding machine for a quick estimate on the best possible focusing quality, which is evaluated by the well-known modulation transfer function (MTF). For actuating the feeding machine, an algorithm, assisted by the feedback MTFs, is proposed to move the test lens to the particular position that renders the best quality. In this way, the focus length—effective focal length (EFL)—of the test lens can be obtained. The proposed algorithm in fact needs much less time of actuation than a traditional tester to obtain EFL of the test lens. The designed and constructed tester is capable of measuring varied optical performance indices for the next-generation tunable lens, like liquid crystal lens.

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Literatur
Zurück zum Zitat Chang GW, Pan SY (2005) DSP-based MTF measurement system for opticali imaging modules. Proc SPIE 5881:58810TCrossRef Chang GW, Pan SY (2005) DSP-based MTF measurement system for opticali imaging modules. Proc SPIE 5881:58810TCrossRef
Zurück zum Zitat Chang GW, Liao CC, Yeh ZM (2007) Accurate and cost-effective MTF measurement system for lens modules of digital cameras. Proc SPIE 6494:64940SCrossRef Chang GW, Liao CC, Yeh ZM (2007) Accurate and cost-effective MTF measurement system for lens modules of digital cameras. Proc SPIE 6494:64940SCrossRef
Zurück zum Zitat Chao PC-P, Kao Y-Y, Hsu C-H (2012) A new negative liquid crystal lens with multiple ring electrodes in unequal width. IEEE Photonics J 4:250–266CrossRef Chao PC-P, Kao Y-Y, Hsu C-H (2012) A new negative liquid crystal lens with multiple ring electrodes in unequal width. IEEE Photonics J 4:250–266CrossRef
Zurück zum Zitat Estribeau M, Magnan P (2004a) Fast MTF measurement of CMOS imagers using ISO 12233 slanted-edge methodology. In: Proceedings of SPIE—the international society for optical engineering, v 5251, detectors and associated signal processing, pp 243–252 Estribeau M, Magnan P (2004a) Fast MTF measurement of CMOS imagers using ISO 12233 slanted-edge methodology. In: Proceedings of SPIE—the international society for optical engineering, v 5251, detectors and associated signal processing, pp 243–252
Zurück zum Zitat Estribeau M, Magnan P (2004b) Fast MTF measurement of CMOS imagers at the chip level using ISO 12233 slanted-edge methodology. In: Proceedings of SPIE—the international society for optical engineering, v 5570, sensors, systems, and next-generation Satellites VIII, pp 557–567 Estribeau M, Magnan P (2004b) Fast MTF measurement of CMOS imagers at the chip level using ISO 12233 slanted-edge methodology. In: Proceedings of SPIE—the international society for optical engineering, v 5570, sensors, systems, and next-generation Satellites VIII, pp 557–567
Zurück zum Zitat Greig T, Holland A, Burt A, Pike A (2007) CMOS pixel structures optimised for scientific imaging applications. In: Proceedings of SPIE—the international society for optical engineering, v 6660, infrared systems and photoelectronic technology II, p 66600T Greig T, Holland A, Burt A, Pike A (2007) CMOS pixel structures optimised for scientific imaging applications. In: Proceedings of SPIE—the international society for optical engineering, v 6660, infrared systems and photoelectronic technology II, p 66600T
Zurück zum Zitat Hwang H, Choi YW, Kwak S, Kim M, Park W (2008) MTF assessment of high resolution satellite images using ISO 12233 slanted-edge method. Proc SPIE 7109:710905CrossRef Hwang H, Choi YW, Kwak S, Kim M, Park W (2008) MTF assessment of high resolution satellite images using ISO 12233 slanted-edge method. Proc SPIE 7109:710905CrossRef
Zurück zum Zitat Kapany NS, Shatzel JL (1968) A MTF analyzer and its applications. In: Optics technology, Inc., SPIE seminar proceeding, p 8217 Kapany NS, Shatzel JL (1968) A MTF analyzer and its applications. In: Optics technology, Inc., SPIE seminar proceeding, p 8217
Zurück zum Zitat Lerman SH (1968) Application of the fast fourier transform to the calculation of the optical transfer function. In: Itke corporation, SPIE seminar proceeding, p 5 Lerman SH (1968) Application of the fast fourier transform to the calculation of the optical transfer function. In: Itke corporation, SPIE seminar proceeding, p 5
Zurück zum Zitat Smith W (1990) Modern optical engineering. McGRAW-HILL Inc, New York Smith W (1990) Modern optical engineering. McGRAW-HILL Inc, New York
Zurück zum Zitat Toshiba Data Book (1992) CCD linear image sensor. Toshiba Corporation, Tokyo Toshiba Data Book (1992) CCD linear image sensor. Toshiba Corporation, Tokyo
Metadaten
Titel
An on-line optical bench tester machine for evaluating lens quality
verfasst von
Paul C.-P. Chao
Yung-Hua Kao
Wei-Hsuan Hsu
Yan-Pean Huang
Publikationsdatum
01.08.2014
Verlag
Springer Berlin Heidelberg
Erschienen in
Microsystem Technologies / Ausgabe 8-9/2014
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-014-2128-5

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