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Experimental Mechanics
Erschienen in: Experimental Mechanics 5/2018

09.02.2018

Asymptotical Correction to Bottom Substrate Effect Arising in AFM Indentation of Thin Samples and Adherent Cells Using Conical Tips

verfasst von: V. Managuli, S. Roy

Erschienen in: Experimental Mechanics | Ausgabe 5/2018

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Abstract

The bottom substrate effect is one of the major sources of error in force map studies of adherent cells and thin soft samples in an atomic force microscope (AFM)-based force spectroscopy. Because of this, samples appear stiffer than the natural. The popular Sneddon’s contact model, which assumes the sample as infinitely thick, fails to correct this error. In the present work, a simple asymptotically correct analytical correction to the bottom substrate effect is derived through contact mechanics approach and later the model is experimentally validated on a wide range of thickness of soft polyacrylamide gel and on adherent cells.
Vorheriger Artikel A Robust in situ TEM Experiment for Characterizing the Fracture Toughness of the Interface in Nanoscale Multilayers
Nächster Artikel Strain Localization in Mild (Low Carbon) Steel Observed by Acoustic Emission - ESPI Coupling during Tensile Test

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Metadaten
Titel
Asymptotical Correction to Bottom Substrate Effect Arising in AFM Indentation of Thin Samples and Adherent Cells Using Conical Tips
verfasst von
V. Managuli
S. Roy
Publikationsdatum
09.02.2018
Verlag
Springer US
Erschienen in
Experimental Mechanics / Ausgabe 5/2018
Print ISSN: 0014-4851
Elektronische ISSN: 1741-2765
DOI
https://doi.org/10.1007/s11340-018-0373-8

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