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Erschienen in:
2005 | OriginalPaper | Buchkapitel
Automatic Test Generation for N-Way Combinatorial Testing
verfasst von : Changhai Nie, Baowen Xu, Liang Shi, Guowei Dong
Erschienen in: Quality of Software Architectures and Software Quality
Verlag: Springer Berlin Heidelberg
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n
-way combinatorial testing is a specification-based testing criterion, which requires that for a system consisting of a few parameters, every combination of valid values of arbitrary
n
(
n
≥ 2) parameters be covered by at least one test. In this paper, we propose two different tests generation algorithms based on the combinatorial design for the
n
-way combination testing. We show that the produced tests can cover all the combinations of parameters to the greatest degree with the small quantity. We implemented the automatic test generators based on the algorithms and obtained some valuable empirical results.