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2004 | OriginalPaper | Buchkapitel

Classifying Materials from Their Reflectance Properties

verfasst von : Peter Nillius, Jan-Olof Eklundh

Erschienen in: Computer Vision - ECCV 2004

Verlag: Springer Berlin Heidelberg

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We explore the possibility of recognizing the surface material from a single image with unknown illumination, given the shape of the surface. Model-based PCA is used to create a low-dimensional basis to represent the images. Variations in the illumination create manifolds in the space spanned by this basis. These manifolds are learnt using captured illumination maps and the CUReT database. Classification of the material is done by finding the manifold closest to the point representing the image of the material. Testing on synthetic data shows that the problem is hard. The materials form groups where the materials in a group often are mis-classifed as one of the other materials in the group. With a grouping algorithm we find a grouping of the materials in the CUReT database. Tests on images of real materials in natural illumination settings show promising results.

Metadaten
Titel
Classifying Materials from Their Reflectance Properties
verfasst von
Peter Nillius
Jan-Olof Eklundh
Copyright-Jahr
2004
Verlag
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-540-24673-2_30

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