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Erschienen in: Journal of Intelligent Manufacturing 7/2020

26.06.2018

Data-driven prognostic method based on self-supervised learning approaches for fault detection

verfasst von: Tian Wang, Meina Qiao, Mengyi Zhang, Yi Yang, Hichem Snoussi

Erschienen in: Journal of Intelligent Manufacturing | Ausgabe 7/2020

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Abstract

As a part of prognostics and health management (PHM), fault detection has been used in many fields to improve the reliability of the system and reduce the manufacturing costs. Due to the complexity of the system and the richness of the sensors, fault detection still faces some challenges. In this paper, we propose a data-driven method in a self-supervised manner, which is different from previous prognostic methods. In our algorithm, we first extract feature indices of each batch and concatenate them into one feature vector. Then the principal components are extracted by Kernel PCA. Finally, the fault is detected by the reconstruction error in the feature space. Samples with high reconstruction error are identified as faulty. To demonstrate the effectiveness of the proposed algorithm, we evaluate our algorithm on a benchmark dataset for fault detection, and the results show that our algorithm outperforms other fault detection methods.

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Metadaten
Titel
Data-driven prognostic method based on self-supervised learning approaches for fault detection
verfasst von
Tian Wang
Meina Qiao
Mengyi Zhang
Yi Yang
Hichem Snoussi
Publikationsdatum
26.06.2018
Verlag
Springer US
Erschienen in
Journal of Intelligent Manufacturing / Ausgabe 7/2020
Print ISSN: 0956-5515
Elektronische ISSN: 1572-8145
DOI
https://doi.org/10.1007/s10845-018-1431-x

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