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Journal of Cryptographic Engineering

Erschienen in:

30.05.2020 | Regular Paper

Detecting faults in inner product masking scheme

IPM-FD: IPM with fault detection (extended version)

verfasst von: Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley

Erschienen in: Journal of Cryptographic Engineering | Ausgabe 2/2021

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Abstract

Side-channel analysis and fault injection attacks are two typical threats to cryptographic implementations, especially in modern embedded devices. Thus, there is an insistent demand for dual side-channel and fault injection protections. As we know, masking is a kind of provable countermeasure against side-channel attacks. Recently, inner product masking (IPM) was proposed as a promising higher-order masking scheme against side-channel analysis, but not for fault injection attacks. In this paper, we devise a new masking scheme named IPM-FD. It is built on IPM, which enables fault detection. This novel masking scheme has three properties: the security orders in the word-level probing model, bit-level probing model and the number of detected faults. IPM-FD is proven secure both in the word-level and in the bit-level probing models and allows for end-to-end fault detection against fault injection attacks. Furthermore, we illustrate its security order by interpreting IPM-FD as a coding problem and then linking it to one defining parameters of linear code and show its implementation cost by applying IPM-FD to AES-128.

Vorheriger Artikel Rock’n’roll PUFs: crafting provably secure pufs from less secure ones (extended version)

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Titel: Detecting faults in inner product masking scheme
IPM-FD: IPM with fault detection (extended version)
verfasst von: Wei Cheng
Claude Carlet
Kouassi Goli
Jean-Luc Danger
Sylvain Guilley
Publikationsdatum: 30.05.2020
Verlag: Springer Berlin Heidelberg
Erschienen in: Journal of Cryptographic Engineering / Ausgabe 2/2021
Print ISSN: 2190-8508
Elektronische ISSN: 2190-8516
DOI: https://doi.org/10.1007/s13389-020-00227-6

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