Anzeige
Erschienen in:
2010 | OriginalPaper | Buchkapitel
Automated Test Scenario Selection Based on Levenshtein Distance
verfasst von : Sapna P.G., Hrushikesha Mohanty
Erschienen in: Distributed Computing and Internet Technology
Verlag: Springer Berlin Heidelberg
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
Specification based testing involves generating test cases from the specification, here, UML. The number of automatically generated test scenarios from UML activity diagrams is large and hence impossible to test completely. This paper presents a method for selection of test scenarios generated from activity diagrams using Levenshtein distance. An activity diagram is transformed into a directed graph representing the sequence of activities. A modified Depth First Algorithm(DFS) is applied to obtain test scenarios. Levenshtein distance is calculated between the scenarios thus generated. The objective is to select the less similar test cases and at the same time provide maximum coverage.