Effect of doping concentration on UV accelerated chemically deposited ZnS:Mn thin films

Pure and Mn alloyed ZnS thin films have been prepared by UV accelerated chemical deposition technique which is simple, economic and easy to monitor. Influence of doping concentration on ZnS thin films was investigated through the structural, compositional, morphological, optical and luminescent studies. The XRD studies confirmed the formation of crystalline films with hexagonal structure. In doped samples the intensities of the prominent peaks increased up to 0.5 wt% Mn and then decreased. The optimum concentration means the amount required to get most suitable characteristics for photovoltaic application. The thickness of the films and the sizes of the crystallites varied in consistent with the structural results. Crystallites became larger in size on doping and appeared to be denser than undoped film. Various structural parameters like stress and micro strain were calculated. The observed strain is compressive in nature which rapidly increased with doping and then remained almost same with doping concentration. The SEM studies revealed the formation of films with almost similar morphology of spherical architectures. All the films exhibited uniform transmission in the high visible region, with a maximum of 80 % for the sample with optimum Mn concentration. Both direct and indirect band gap decreased due to the incorporation of Mn, but showed a blue shift in the fundamental absorption edge with doping concentration up to the optimum dopant content. Undoped and doped films exhibit five distinct luminescence peaks located around 391, 451, 458, 482 and 492 nm. The observed variation in the intensity of the luminescence in doped films clearly indicated the influence of thickness of the films which varied on doping.