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Erschienen in: Journal of Materials Science: Materials in Electronics 14/2020

28.05.2020

Effects of W/Ni co-doping on the structural, magnetic, electrical, and optical properties of Aurivillius phase Bi5FeTi3O15 ceramics

verfasst von: Xuzhong Zuo, Zhenzhen Hui, Enjie He, Gaochao Zhao, Jin Bai, Jie Wu, Shunjin Zhu, Xucai Kan, Wenhai Song, Jie Yang, Xuebin Zhu, Jianming Dai

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 14/2020

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Abstract

We investigate the influences of W/Ni co-doping on the structural, magnetic, electrical, and optical properties of four-layered Aurivillius Bi5FeTi3O15 ceramics. All the specimens can be indexed with the orthorhombic structure and the space group of A21am. The incorporation of W/Ni significantly promotes the grain’s growth and compactness. Compared with the antiferromagnetic state in pure sample, a weak room-temperature ferromagnetic state is found in the doped samples. The dielectric relaxations in samples with x ≤ 0.1 follow with Vogel–Fulcher relation and can be ascribed to the fluctuation behavior of local polarization, whereas the dielectric relaxation in sample x = 0.15 obeys well Arrhenius law and is due to the localized hopping process of electrons. The piezoelectric measurements indicate that the composition x = 0.05 represents the largest d33 value of 14pC/N at room temperature, which can be attributed to the optimal conductivity. In addition, all the compositions have two absorption edges with the direct inter-band transition due to the electron excitation from the hybridized Bi 6s + O 2p + Fe t2g valence band to Fe eg and Ti 3d conduction bands.

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Metadaten
Titel
Effects of W/Ni co-doping on the structural, magnetic, electrical, and optical properties of Aurivillius phase Bi5FeTi3O15 ceramics
verfasst von
Xuzhong Zuo
Zhenzhen Hui
Enjie He
Gaochao Zhao
Jin Bai
Jie Wu
Shunjin Zhu
Xucai Kan
Wenhai Song
Jie Yang
Xuebin Zhu
Jianming Dai
Publikationsdatum
28.05.2020
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 14/2020
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-03662-7

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