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Erschienen in: Journal of Computational Electronics 1/2019

09.11.2018

Efficient two-level parallelization approach to evaluate spin relaxation in a strained thin silicon film

verfasst von: Joydeep Ghosh, Dmitry Osintsev, Viktor Sverdlov

Erschienen in: Journal of Computational Electronics | Ausgabe 1/2019

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Abstract

The evaluation of the spin lifetime in an ultra-thin silicon film is a massive computational challenge because of the necessity of performing appropriate double integration of the strongly scattering momentum-dependent spin relaxation rates. We have tackled the problem by dividing the whole computation range into two levels. Our scheme in each level is based on a hybrid parallelization approach, using the message passing interface MPI and OpenMP. In the first level, the algorithm precalculates the subband wave functions corresponding to fixed energies and archives the results in a file-based cache to reduce memory consumption. In the second level, we compute the spin relaxation time by using the archived data in parallel. This two-level computation approach shows an excellent parallel speedup, and most efficient ways to maximally utilize the computational resources are described. Finally, how an application of shear strain can dramatically increase the spin lifetime is shown.

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Metadaten
Titel
Efficient two-level parallelization approach to evaluate spin relaxation in a strained thin silicon film
verfasst von
Joydeep Ghosh
Dmitry Osintsev
Viktor Sverdlov
Publikationsdatum
09.11.2018
Verlag
Springer US
Erschienen in
Journal of Computational Electronics / Ausgabe 1/2019
Print ISSN: 1569-8025
Elektronische ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-018-1274-x

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