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Optical and Quantum Electronics
Erschienen in: Optical and Quantum Electronics 11/2018

01.11.2018

Ellipsometry of anisotropic graphene-like two-dimensional materials on transparent substrates

verfasst von: Peep Adamson

Erschienen in: Optical and Quantum Electronics | Ausgabe 11/2018

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Abstract

New possibilities for determining anisotropic properties of the dielectric constants of two-dimensional materials by ellipsometry are developed. Graphene-like 2D materials are considered within the framework of macroscopic electrodynamics as ultrathin absorbing anisotropic films where the optical axis is perpendicular to the film surface. The ellipsometric inversion problem is resolved analytically. The resulting inversion formulas are very fast because they allow you to directly calculate the complex anisotropic dielectric constants without the use of sophisticated regression analysis or iterative root-finding procedures. In particular, the method offers an interest in graphene and related 2D materials because the anisotropic properties of such materials have not been studied to date.
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Metadaten
Titel
Ellipsometry of anisotropic graphene-like two-dimensional materials on transparent substrates
verfasst von
Peep Adamson
Publikationsdatum
01.11.2018
Verlag
Springer US
Erschienen in
Optical and Quantum Electronics / Ausgabe 11/2018
Print ISSN: 0306-8919
Elektronische ISSN: 1572-817X
DOI
https://doi.org/10.1007/s11082-018-1673-z

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