Ausgabe 1/2005
Inhalt (13 Artikel)
Laser-induced stress wave thermometry applied to silicon wafer processing: Modeling and experimentation
G. A. Rabroker, C. S. Suh, R. Chona
Study of three-dimensional deformation of a pallet using phase-shiff shadow moiré and finite-element analysis
M. M. Ratnam, J. H. Lim, H. P. S. Abdul Khalil
Pattern evaluation for in-plane displacement measurement of thin films
P. Thota, J. Leifer, S. W. Smith, J. K. Lumpp
Inverse method to determine elastic constants using a circular disk and moiré interferometry
Z. Wang, J. F. Cárdenas-García, B. Han
A new photoelastic model for studying fatigue crack closure
M. N. Pacey, M. N. James, E. A. Patterson
Deformation measurement by phase-shifting digital holography
Y. Morimoto, T. Nomura, M. Fujigaki, S. Yoneyama, I. Takahashi
Three-dimensional point cloud registration by matching surface features with relaxation labeling method
N. Li, P. Cheng, M. A. Sutton, S. R. McNeill
Residual stress analysis near a cold expanded hole in a textured alclad sheet using X-ray diffraction
J. C. P. Pina, A. M. Dias, P. F. P. de Matos, P. M. G. P. Moreira, P. M. S. T. de Castro
Monitoring surface breaking defects with piezoelectric active systems
S. R. K. Morikawa, A. L. Gama, A. M. B. Braga, R. R. Correia
Full-scale, low-temperature mechanical testing of prestressing systems
R. Christen, A. Bergamini, K. Ghazi Wakili