Experimentation for a Better Magnetic Force Microscopy Probe

Magnetic force microscopy (MFM) has been generally used to concentrate on the polarization construction of hard-plate drive (HDD) media, super durable magnets, and different materials. The HDD medium's areal thickness is presently moving toward 1 Tb/in², in spite of the way that the piece pitch is just 20–30 nm. The MFM tip will be exposed to a solid attractive field. As well as accomplishing a high goal better than 10 nm, the acknowledgment of a MFM tip with a high exchanging field (Hsw) is required. Much of the time, MFM tips are made by covering non-attractive sharp tips with attractive magnetic films. MFM performance is influenced by the shape of the MFM tip and the magnetic property of the coating material. In this work, we have tried to coat the existing commercially available atomic force microscopy tip (AFM) with a superparamagnetic material to make it work as an MFM tip. The main advantage of coating with superparamagnetic material that it has low coercivity and medium saturation magnetization which is an important factor that leads to a good contrast image of any sample that is scanned under MFM. We have tried to find out the appropriate material by surveying various literature and finally decided to coat FeGa thin film because of its superparamagnetic behavior and low coercivity in nature, after coating the standard AFM tip with FeGa film by a sputtering method under the optimal condition which we got by attempting various deposition condition and varying parameter, later that coated tip is used as an MFM tip, and scanning was performed on magnetic samples.