Ausgabe 2/2006
Inhalt (20 Artikel)
High-speed imaging of an ultrasound-driven bubble in contact with a wall: “Narcissus” effect and resolved acoustic streaming
Philippe Marmottant, Michel Versluis, Nico de Jong, Sascha Hilgenfeldt, Detlef Lohse
Stereoscopic micro particle image velocimetry
Ralph Lindken, Jerry Westerweel, Bernhard Wieneke
Measurements of the minimum elevation of nano-particles by 3D nanoscale tracking using ratiometric evanescent wave imaging
C. H. Margraves, C. K. Choi, K. D. Kihm
X-ray PIV measurements of blood flows without tracer particles
Guk Bae Kim, Sang Joon Lee
Acceleration data correlated with PIV images for self-induced vibrations of an airfoil
E. Tinar, O. Cetiner
Time-resolved reconstruction of the full velocity field around a dynamically-scaled flapping wing
C. Poelma, W. B. Dickson, M. H. Dickinson
Instantaneous pressure and material acceleration measurements using a four-exposure PIV system
Xiaofeng Liu, Joseph Katz
Time resolved PIV analysis of flow over a NACA 0015 airfoil with Gurney flap
D. R. Troolin, E. K. Longmire, W. T. Lai
Particle velocimetry in high-gradient/high-curvature flows
J. M. Bergthorson, P. E. Dimotakis
Assessment of dual plane PIV measurements in wall turbulence using DNS data
Neelakantan Saikrishnan, Ivan Marusic, Ellen K. Longmire
Robust evaluation of the dissimilarity between interrogation windows in image velocimetry
M. Falchi, G. Querzoli, G. P. Romano
A comparison of PIV measurements of canopy turbulence performed in the field and in a wind tunnel model
W. Zhu, R. van Hout, L. Luznik, H. S. Kang, J. Katz, C. Meneveau
Scanning PIV measurements of a laminar separation bubble
S. Burgmann, C. Brücker, W. Schröder
Wall-shear-stress and near-wall turbulence measurements up to single pixel resolution by means of long-distance micro-PIV
C. J. Kähler, U. Scholz, J. Ortmanns
Turbulent shear stress profiles in a bubbly channel flow assessed by particle tracking velocimetry
Y. Murai, Y. Oishi, Y. Takeda, F. Yamamoto
Application of PIV in a Mach 7 double-ramp flow
F. F. J. Schrijer, F. Scarano, B. W. van Oudheusden