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2017 | OriginalPaper | Buchkapitel

FEM Based Device Simulator for High Voltage Devices

verfasst von : Ashok Ray, Gaurav Kumar, Sushanta Bordoloi, Dheeraj Kumar Sinha, Pratima Agarwal, Gaurav Trivedi

Erschienen in: VLSI Design and Test

Verlag: Springer Singapore

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Abstract

TCAD simulation of electronic device has always been the basic approach to understand solid state electronics and to frame road-map for the evolution of future technology. Design of devices on these materials require better understanding of the physical insights to the internals of the device structure. In such a scenario, TCAD tool can help to visualize internal dynamics of carriers and fields in the device structure, thus helping to improve them further. Device structures are evolving continuously leading to an increase in complexity of computation of simulation. There is an increasing challenge to these simulators to improvise compact device models, whereby generating precise results. The responsibility of TCAD designers is ever increasing to develop improved solvers featuring better predictive capabilities. In this work, an effort has been made to compare the performance of an FEM based proposed simulator with conventional available device simulator. A simple pn junction diode is designed in both the simulators and a comparison of different electrical properties has been done by incorporating similar models and exactly same material parameters.

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Metadaten
Titel
FEM Based Device Simulator for High Voltage Devices
verfasst von
Ashok Ray
Gaurav Kumar
Sushanta Bordoloi
Dheeraj Kumar Sinha
Pratima Agarwal
Gaurav Trivedi
Copyright-Jahr
2017
Verlag
Springer Singapore
DOI
https://doi.org/10.1007/978-981-10-7470-7_14

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