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Erschienen in:
2005 | OriginalPaper | Buchkapitel
High-Level Restructuring of TTCN-3 Test Data
verfasst von : Antal Wu-Hen-Chang, D ung Le Viet, Gabor Batori, Roland Gecse, Gyula Csopaki
Erschienen in: Formal Approaches to Software Testing
Verlag: Springer Berlin Heidelberg
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TTCN-3 (Testing and Test Control Notation 3) [1,2,3] test suites developed for testing complicated systems contain a large number of test data definitions. These definitions are often redundant and lengthy, which leads to compilation and run-time inefficiencies. Our intention is to provide remedy for this problem, by proposing a method that restructures the test data definitions of an already existing TTCN-3 module. In this paper we introduce a model for TTCN-3 test data and a method for its optimization. The results of an empirical study using our approach is presented as well.