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Erschienen in: Journal of Materials Science: Materials in Electronics 6/2017

21.11.2016

Influence of annealing temperature on formation and photoelectric properties of AZO nanosheet-coated FTO-based films

verfasst von: Li-jing Huang, Bao-jia Li, Hai-di Cao, Wei Zu, Nai-fei Ren, Hua Ding

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 6/2017

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Abstract

In this work, we reported a direct fabrication of Al-doped zinc oxide (AZO) nanosheets on fluorine-doped tin oxide (FTO)-based substrates using thermal annealing method. Specifically, silver (Ag) and AZO layers were successively deposited on commercial FTO/glass by direct current magnetron sputtering, and then the as-deposited AZO/Ag/FTO films were thermally annealed in a tube furnace to prepare AZO nanosheets. The effects of annealing temperature on the AZO nanosheet morphology and the performance of AZO/Ag/FTO films were investigated by an X-ray diffractometer, a scanning electron microscope, an energy dispersive spectrometer, optical transmittance spectra, reflectance spectra and a digital four-point probe instrument. It was found that a suitable temperature resulted in the formation of AZO nanosheets, which could effectively decrease the reflectance and thus improve the transmittance of the films. Smaller densely-distributed AZO nanosheets were observed on the film annealed at 450 °C, enabling it to have the highest average transmittance of 81.0% and the lowest reflectance of 6.3% in the waveband of 400–800 nm. The results also showed that the film annealed at 450 °C had the highest figure of merit of 2.59 × 10−2 Ω−1, which was more than four times that of the as-deposited film (0.57 × 10−2 Ω−1). This work demonstrates the availability of preparing AZO nanosheets by thermal annealing and provides a reference for improving overall photoelectric property of transparent conducting oxide films.

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Metadaten
Titel
Influence of annealing temperature on formation and photoelectric properties of AZO nanosheet-coated FTO-based films
verfasst von
Li-jing Huang
Bao-jia Li
Hai-di Cao
Wei Zu
Nai-fei Ren
Hua Ding
Publikationsdatum
21.11.2016
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 6/2017
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-016-6112-y

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