Skip to main content

1989 | OriginalPaper | Buchkapitel

Infrared and Raman Microspectroscopy: An Overview of their Use in the Identification of Microscopic Particulates

verfasst von : Patricia L. Lang, Andre’ J. Sommer, J. E. Katon

Erschienen in: Particles on Surfaces 2

Verlag: Springer US

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

The recent coupling of infrared and Raman spectrometers with microscopes has provided the analyst with two very powerful new tools for identification of microscopic particulates. Unlike other analytical tools, these microspectroscopic techniques yield molecular, as opposed to elemental, information. Both infrared and Raman microspectroscopy are reviewed with respect to their historical development and their respective advantages, limitations and capabilities. The two methods are then discussed in terms of their complementarity in solving chemical identification problems, and it is shown that both methods are often needed for complete sample characterization. Finally, their application to the identification of microscopic particulates is illustrated by two case studies: identification of solder flux residue contamination and characterization of various dust particles.

Metadaten
Titel
Infrared and Raman Microspectroscopy: An Overview of their Use in the Identification of Microscopic Particulates
verfasst von
Patricia L. Lang
Andre’ J. Sommer
J. E. Katon
Copyright-Jahr
1989
Verlag
Springer US
DOI
https://doi.org/10.1007/978-1-4613-0531-6_11

    Marktübersichten

    Die im Laufe eines Jahres in der „adhäsion“ veröffentlichten Marktübersichten helfen Anwendern verschiedenster Branchen, sich einen gezielten Überblick über Lieferantenangebote zu verschaffen.