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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 9/2020

28.03.2020

Investigation of gamma and neutron shielding parameters for borosilicate glasses doped europium oxide for the immobilization of radioactive waste

verfasst von: H. A. Saudi, W. M. Abd-Allah, Kh. S. Shaaban

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 9/2020

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Abstract

Eu3+-doped borosilicate glasses were prepared by the melt-quenching method. Optical, physical and nuclear shielding properties of these glasses were studied. The FTIR measurements indicated that the continuous increase of europium concentration helped conversion of [BO4] to [BO3] groups. FTIR spectroscopy results were in good agreement with optical band energy gap, density and molar volume values revealing network modifications caused by europium ions in the glass structure. The amorphous natures of the samples were ascertained by XRD studies. Optical properties of the glass samples are studied before and after neutron at room temperature. The absorption spectra of all glasses indicated that there is a decrease in the optical band gap values due to the enhancement of the number of non-bridging oxygen (NBO) atoms with the addition of Eu2O3. Nuclear shielding properties of these have been investigated. The mass attenuation coefcients have been calculated using the XCOM program.
Vorheriger Artikel Elucidation of the properties of Lithium bis(2-methyllactato) borate monohydrate crystal for laser applications
Nächster Artikel Ethylene glycol/citric acid stabilized wet chemically synthesized Y2CoNiO6, and its structural, dielectric, magnetic and electrochemical behavior

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Metadaten
Titel
Investigation of gamma and neutron shielding parameters for borosilicate glasses doped europium oxide for the immobilization of radioactive waste
verfasst von
H. A. Saudi
W. M. Abd-Allah
Kh. S. Shaaban
Publikationsdatum
28.03.2020
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 9/2020
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-03261-6

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