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Journal of Electronic Materials

Ausgabe 12/2002

Inhalt (11 Artikel)

Regular Issue Paper

The H2 plasma treatment of silver contacts: Impact on wire-bonding performance

M. Bielmann, P. Ruffieux, P. Schwaller, P. Sudan, L. Schlapbach, P. Gröning

Regular Issue Paper

Photo-ionization spectroscopy of traps in AlGaN/GaN high-electron mobility transistors

M. Wolter, P. Javorka, A. Fox, M. Marso, H. Lüth, P. Kordoš, R. Carius, A. Alam, M. Heuken

Regular Issue Paper

Photonic effects during low-temperature ultraviolet-assisted oxidation of SiGe

V. Craciun, R. K. Singh, Ian W. Boyd

Regular Issue Paper

Schottky enhancement of contacts to n-(In0.52Al0.48)As using PdAl as a metallization

D. Ingerly, C. -F. Lin, C. Pelto, Y. A. Chang

Regular Issue Paper

Heteroepitaxial silicon-carbide nitride films with different carbon sources on silicon substrates prepared by rapid-thermal chemical-vapor deposition

Shyh-Fann Ting, Yean-Kuen Fang, Wen-Tse Hsieh, Yong-Shiuan Tsair, Cheng-Nan Chang, Chun-Sheng Lin, Ming-Chun Hsieh, Hsin-Che Chiang, Jyh-Jier Ho

Regular Issue Paper

Schottky barrier height studies of Au/4H-SiC(0001) using photoemission and synchrotron radiation

C. Virojanadara, P. -A. Glans, T. Balasubramanian, L. I. Johansson, E. B. Macak, Q. Wahab, L. D. Madsen

Regular Issue Paper

Anisotropic and selective grain growth during ohmic contact formation

Qianghua Xie, Peter Fejes, Ha Le, Ellen Lan

Regular Issue Paper

The Cu/n-GaAs schottky barrier diodes prepared by anodization process

Mehmet Biber, Abdulmecit Türüt

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